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Baudelaire Sämtliche Werke / Briefe. Nouvelles Fleurs du Mal. Neue Blumen des Bösen Materialien. Band 4.
Editore: München, Heimeran Verlag, 1975., 1975
ISBN 10: 3776501510 ISBN 13: 9783776501513
Da: Antiquariat Hans Hammerstein OHG, München, Germania
Valutazione del venditore 4 su 5 stelle
EUR 12,00
EUR 35,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloorigi.Leinenband mit Schutzumschlag, 8°, 347 Seiten. Schutzumschlag verblasst sonst guter Zustand.
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Surrealism in Paris
Da: Midtown Scholar Bookstore, Harrisburg, PA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Very Good. Jumbo-sized. Very Good - Crisp, clean, unread book with some shelfwear/edgewear, may have a remainder mark - NICE.
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Surrealism in Paris
Da: Glands of Destiny First Edition Books, Sedro Woolley, WA, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Like New. First Paperback Edition. Publisher: Fondation Beyeler, 2011. FINE softcover in illustrated/pictorial French wraps, as issued. First Edition in English, First Printing. As new. Pristine.
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Surrealism in Paris
Da: Midtown Scholar Bookstore, Harrisburg, PA, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Good. some shelfwear/edgewear but still NICE! - may have remainder mark or previous owner's name Jumbo-sized.
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Surrealism in Paris
Da: Books From California, Simi Valley, CA, U.S.A.
Valutazione del venditore 5 su 5 stelle
hardcover. Condizione: Good. Ex-library book with stickers and/or stamps throughout.
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Baudelaire Sämtliche Werke / Briefe. Juvenilia Kunstkritik.
Editore: München, Heimeran Verlag, 1975., 1975
Da: Antiquariat Hans Hammerstein OHG, München, Germania
Valutazione del venditore 4 su 5 stelle
EUR 9,00
EUR 35,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloorigi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. Schutzumschlag mit Kratzer und Einriss, sonst gut.
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Baudelaire Sämtliche Werke / Briefe. Juvenilia Kunstkritik.
Editore: München, Heimeran Verlag, 1975., 1975
Da: Antiquariat Hans Hammerstein OHG, München, Germania
Valutazione del venditore 4 su 5 stelle
EUR 12,00
EUR 35,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloorigi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.
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Surrealismus in Paris
Da: Antiquariat Hans Hammerstein OHG, München, Germania
Valutazione del venditore 4 su 5 stelle
EUR 32,00
EUR 35,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloOriginal Leinenband mit Schutzumschlag, Gr.-4, 290 Seiten Guter Zustand.
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EUR 12,50
EUR 45,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Kurzbeschreibung: Eine Reihe Briefe aus den Jahren 1832-1846 von Charles Baudelaire. Zustand: Schutzumschlag mit geringfügigen Gebrauchsspuren, kleine Fremdsignatur auf dem Vorsatzblatt, Schutzumschlag am Buchrücken leicht verblichen, insgesamt SEHR GUTER Zustand! 522 Seiten Deutsch 670g Hardcover mit Schutzumschlag, Leinen-Einband.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 158,72
EUR 13,75 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 158,72
EUR 13,75 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 158,71
EUR 17,21 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: As New. Unread book in perfect condition.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 179,74
EUR 17,21 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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EUR 45,47
EUR 105,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 224.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 224.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Lingua: Inglese
Editore: Springer-Verlag New York Inc., US, 2010
ISBN 10: 1441965874 ISBN 13: 9781441965875
Da: Rarewaves.com USA, London, LONDO, Regno Unito
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EUR 224,29
Spedizione gratuita
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloHardback. Condizione: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
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EUR 165,03
EUR 61,74 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
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EUR 166,62
EUR 62,40 shipping
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Lingua: Inglese
Editore: Springer-Verlag New York Inc., 2012
ISBN 10: 1461426170 ISBN 13: 9781461426172
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 229,16
EUR 11,47 shipping
Spedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 222 pages. 9.20x6.10x0.51 inches. In Stock.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing (Integrated Circuits and Systems)
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 224,55
EUR 28,69 shipping
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Lingua: Inglese
Editore: Springer-Verlag New York Inc., US, 2010
ISBN 10: 1441965874 ISBN 13: 9781441965875
Da: Rarewaves.com UK, London, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 213,42
EUR 74,58 shipping
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloHardback. Condizione: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.
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Surrealism in Paris
Da: AwardWinningBooks, Spring Branch, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Fine. Condizione sovraccoperta: Very Good. Short tail tear.
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EUR 13,66
EUR 105,00 shipping
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: as new. Wie neu/Like new.
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Dali, Ernst, Miro: Surrealism in Paris (German Edition)
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 232,82
EUR 28,69 shipping
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrellohardcover. Condizione: Very Good. Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Coupled Data Communication Techniques for High-Performance and Low-Power Computing
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 160,49
EUR 23,00 shipping
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. 206 pp. Englisch.
