Robert drost (40 risultati)

Hardcover. Condizione: Good. Jumbo-sized. Good - Bumped and creased book with tears to the extremities, but not affecting the text block, may have remainder mark or previous owner's name - GOOD.

Hardcover. Condizione: Very Good. Jumbo-sized. Very Good - Crisp, clean, unread book with some shelfwear/edgewear, may have a remainder mark - NICE.

hardcover. Condizione: Like New. First Paperback Edition. Publisher: Fondation Beyeler, 2011. FINE softcover in illustrated/pictorial French wraps, as issued. First Edition in English, First Printing. As new. Pristine.

hardcover. Condizione: Good. Ex-library book with stickers and/or stamps throughout.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. Schutzumschlag mit Kratzer und Einriss, sonst gut.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.

origi.Leinenband mit Schutzumschlag, 8°, ca.340 Seiten. neuwertig.

Original-Leinenband mit Schutzumschlag, 8°, 347 Seiten. Schutzumschlag verblasst sonst guter Zustand.

Condizione: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Condizione: New.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: New. In English.

Condizione: New. In English.

Condizione: As New. Unread book in perfect condition.

Hardback. Condizione: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. …

Taschenbuch. Condizione: Neu. Coupled Data Communication Techniques for High-Performance and Low-Power Computing | Ron Ho (u. a.) | Taschenbuch | Integrated Circuits and Systems | xvi | Englisch | 2012 | Springer | EAN 9781461426172 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a aw. If such aws were the result only of dust one might reduce their numbers, but aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible.…

Condizione: New. pp. 224.

Condizione: New. pp. 224.

Paperback. Condizione: Brand New. 222 pages. 9.20x6.10x0.51 inches. In Stock.

Hardback. Condizione: New. 2010 ed. Wafer-scale integration has long been the dream of system designers. Instead of chopping a wafer into a few hundred or a few thousand chips, one would just connect the circuits on the entire wafer. What an enormous capability wafer-scale integration would offer: all those millions of circuits connected by high-speed on-chip wires. Unfortunately, the best known optical systems can provide suitably ?ne resolution only over an area much smaller than a whole wafer. There is no known way to pattern a whole wafer with transistors and wires small enough for modern circuits. Statistical defects present a ?rmer barrier to wafer-scale integration. Flaws appear regularly in integrated circuits; the larger the circuit area, the more probable there is a ?aw. If such ?aws were the result only of dust one might reduce their numbers, but ?aws are also the inevitable result of small scale. Each feature on a modern integrated circuit is carved out by only a small number of photons in the lithographic process. Each transistor gets its electrical properties from only a small number of impurity atoms in its tiny area. Inevitably, the quantized nature of light and the atomic nature of matter produce statistical variations in both the number of photons de?ning each tiny shape and the number of atoms providing the electrical behavior of tiny transistors. No known way exists to eliminate such statistical variation, nor may any be possible. …

Hardcover. Condizione: New. Surrealism rose from the ruins of interbellum Europe to become one of the most influential artistic and literary movements of the twentieth century. Under the leadership of Andrà Breton, Surrealist artists undertook a passionate search for "freedom in all of its forms," delving into the imagery and language of the subconscious through the revolutionary methods of automatism, radical juxtaposition and chance. Surrealism in Paris reproduces a spectacular selection of artworks from the Fondation Beyeler's exhibition of the same name. Featuring key paintings, sculptures and works on paper by Hans (Jean) Arp, Hans Bellmer, Salvador DalÃ, Giorgio di Chirico, Marcel Duchamp, Max Ernst, Alberto Giacometti, Renà Magritte, Man Ray, Andrà Masson, Joan Mirà , Meret Oppenheim, Francis Picabia, Pablo Picasso and Yves Tanguy, and essays by a host of renowned scholars, this substantial catalogue revisits a crucial moment in French cultural history. …

Softcover. Condizione: Sehr gut. 1. Auflage. M : 290 Seiten, 304 Abb. - Anhand von beispielhaft präsentierten Werken prominenter Vertreter des Surrealismus, neben Salvador Dalí, Max Ernst und Joan Miró auch René Magritte, Yves Tanguy oder Meret Oppenheim, werden charakteristische Wirkweisen und Strategien des Surrealismus erfahrbar. Nicht nur zeitgenössische Künstler finden darin Quellen der Inspiration und aktuelle Bezüge.…

Original Leinenband mit Schutzumschlag, Gr.-4, 290 Seiten Guter Zustand.

Orig.-Leder mit Folienumschlag. Condizione: Gut. 463 S. 9783446133280 krankheitsbedingt erfolgt der Versand nur 1x pro Woche. Sprache: Deutsch Gewicht in Gramm: 550.

Condizione: new. Questo è un articolo print on demand.