Seong h kim (37 risultati)

Condizione: As New. Unread book in perfect condition.

Condizione: New.

Paperback. Condizione: new. Paperback. Phenomena associated with the adhesion interaction of surfaces have been a critical aspect of micro- and nanosystem development and performance since the first MicroElectroMechanicalSystems(MEMS) were fabricated. These phenomena are ubiquitous in nature and are present in all systems, however MEMS devices are particularly sensitive to their effects owing to their small size and limited actuation force that can be generated. Extension of MEMS technology concepts to the nanoscale and development of NanoElectroMechanicalSystems(NEMS) will result in systems even more strongly influenced by surface forces.The book is divided into five parts as follows: Part 1: Understanding Through Continuum Theory; Part 2: Computer Simulation of Interfaces; Part 3: Adhesion and Friction Measurements; Part 4: Adhesion in Practical Applications; andPart 5: Adhesion Mitigation Strategies.This compilation constitutes the first book on this extremely important topic in the burgeoning field of MEMS/NEMS. It is obvious from the topics covered in this book that bountiful information is contained here covering understanding of surface forces and adhesion as well as novel ways to mitigate adhesion in MEMS/NEMS.This book should be of great interest to anyone engaged in the wonderful and fascinating field of MEMS/NEMS, as it captures the current R&D activity. This book discusses equilibrium vapor adsorption and capillary force, and effects of contacting surfaces on MEMS device reliability. It serves as a fountainhead for new research ideas and new application vistas and enhances the performance and durability/robustness of MEMS/NEMS. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Couverture rigide. Condizione: bon. R200080552: VERS 2009. In-4. Relié. Bon état, Couv. convenable, Dos satisfaisant, Intérieur frais. Environ 36 pages. Tampons et/ou annotations de bibliothèque, en page de titre et/ou contreplats + 1 étiquette de bibliothèque sur le 1er plat ou dos, et/ou 1 pochette de prêt en 2ème contreplat. Nombreuses illustrations en couleurs dans et/ou hors texte. . . . Classification Dewey : 890-Littératures des autres langues. Kim, Dong-seong (illustratore).…

Condizione: New. pp. 422.

Paperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.

Condizione: New.

Paperback. Condizione: new. Paperback. Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schroedinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on: Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surfaceGovernance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interfaceSurface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentationArtifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Condizione: As New. Unread book in perfect condition.

Condizione: New.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: As New. Unread book in perfect condition.

Condizione: new.

Condizione: New. pp. 422.

Condizione: New. pp. 422.

Condizione: New.

Condizione: New. 2019. 1st Edition. paperback. . . . . .

Condizione: As New. Unread book in perfect condition.

Condizione: New. 1st edition NO-PA16APR2015-KAP.

Paperback. Condizione: new. Paperback. Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schroedinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on: Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surfaceGovernance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interfaceSurface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentationArtifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…

Paperback. Condizione: New. Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on: Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surfaceGovernance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interfaceSurface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentationArtifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.…

Condizione: New.

Paperback. Condizione: Brand New. 420 pages. 9.64x6.69x0.96 inches. In Stock.

Condizione: New. In English.

Paperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.

Condizione: New. 2019. 1st Edition. paperback. . . . . . Books ship from the US and Ireland.

Paperback. Condizione: new. Paperback. Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schroedinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis: Principles and Applications includes information on: Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, X-rays, and secondary ions emitted from the surfaceGovernance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interfaceSurface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentationArtifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condizione: New. Kim, Seong H. Dugger, Michael T. Mittal, Kash L.Phenomena associated with the adhesion interaction of surfaces have been a critical aspect of micro- and nanosystem development and performance since the first MicroElectroMechanicalSystems(MEMS) .

Condizione: New. 2025. 1st Edition. paperback. . . . . .

Hardcover. Condizione: New.