Seongil im (17 risultati)
Lingua: Inglese
Editore: Springer, 2013
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condizione: New.
Lingua: Inglese
Editore: Springer, 2013
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 58,22
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Condizione: Brand New. New. Delivery takes 25-30 days. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2013
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 50,81
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Condizione: New. In.
Lingua: Inglese
Editore: Springer, 2013
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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Condizione: New.
Lingua: Inglese
Editore: Springer, 2013
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 72,07
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Condizione: New. pp. 116.
Lingua: Inglese
Editore: Springer Verlag, 2013
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 69,43
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Paperback. Condizione: Brand New. 2013 edition. 101 pages. 9.00x6.25x0.25 inches. In Stock.
Lingua: Inglese
Editore: Springer, Springer, 2013
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 54,82
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly dep…ending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.
Altre immaginiLingua: Inglese
Editore: Springer, 2013
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Da: preigu, Osnabrück, Germaniapreigu
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EUR 47,50
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Photo-Excited Charge Collection Spectroscopy | Probing the traps in field-effect transistors | Seongil Im (u. a.) | Taschenbuch | xi | Englisch | 2013 | Springer | EAN 9789400763913 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[a…t]springer[dot]com | Anbieter: preigu.
Lingua: Inglese
Editore: Springer, 2013
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
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EUR 124,07
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Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer, 2013
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer Netherlands, 2013
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Da: Buchpark, Trebbin, GermaniaBuchpark
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EUR 34,71
EUR 105,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Condizione: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly dep…ending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.
Lingua: Inglese
Editore: Springer, 2013
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 145,63
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Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer, 2013
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- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer Netherlands Mai 2013, 2013
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 49,99
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus importa…nt, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational. 116 pp. Englisch.
Lingua: Inglese
Editore: Springer, 2013
- Brossura
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 71,61
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Condizione: New. Print on Demand pp. 116 61 Illus.
Lingua: Inglese
Editore: Springer, 2013
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Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 73,52
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Condizione: New. PRINT ON DEMAND pp. 116.
Lingua: Inglese
Editore: Springer, Springer Mai 2013, 2013
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 49,99
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important,…strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself.This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 116 pp. Englisch.
