Lingua: Inglese
Editore: Springer International Publishing AG, Cham, 2016
ISBN 10: 3031009029 ISBN 13: 9783031009020
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condizione: new. Paperback. RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments andthe electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAMs potential novel applications beyond the NVM applications. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Lingua: Inglese
Editore: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: Our Kind Of Books, Liphook, Regno Unito
EUR 12,12
Quantità: 2 disponibili
Aggiungi al carrelloSoft cover. Condizione: As New. This book has been in storage since publication and is unread. Hence the description as new. Synopsis: RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed.
EUR 30,28
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 78 pages. 9.25x7.51x9.25 inches. In Stock.
Lingua: Inglese
Editore: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. pp. 80.
Lingua: Inglese
Editore: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: Majestic Books, Hounslow, Regno Unito
EUR 38,05
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 80.
Lingua: Inglese
Editore: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: BooksRun, Philadelphia, PA, U.S.A.
Paperback. Condizione: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Lingua: Inglese
Editore: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: BooksRun, Philadelphia, PA, U.S.A.
Paperback. Condizione: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
Lingua: Inglese
Editore: Morgan & Claypool Publishers (edition ), 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: BooksRun, Philadelphia, PA, U.S.A.
Paperback. Condizione: New. The item is brand new, never used or read. It's in perfect condition and may include supplements and/or access codes or come shrink-wrapped.
Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. 1st edition NO-PA16APR2015-KAP.
Lingua: Inglese
Editore: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 38,91
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New. pp. 80.
Lingua: Inglese
Editore: Morgan & Claypool Publishers, 2016
ISBN 10: 1627059296 ISBN 13: 9781627059299
Da: Basi6 International, Irving, TX, U.S.A.
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Condizione: New.
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Condizione: As New. Unread book in perfect condition.
EUR 63,82
Quantità: 1 disponibili
Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
EUR 73,01
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Taylor and Francis Ltd, GB, 2025
ISBN 10: 0367687151 ISBN 13: 9780367687151
Da: Rarewaves.com USA, London, LONDO, Regno Unito
EUR 73,96
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. This book covers semiconductor memory technologies from device bit-cell structures to memory array design with an emphasis on recent industry scaling trends and cutting-edge technologies. The first part of the book discusses the mainstream semiconductor memory technologies. The second part of the book discusses the emerging memory candidates that may have the potential to change the memory hierarchy, and surveys new applications of memory technologies for machine/deep learning applications. This book is intended for graduate students in electrical and computer engineering programs and researchers or industry professionals in semiconductors and microelectronics. Explains the design of basic memory bit-cells including 6-transistor SRAM, 1-transistor-1-capacitor DRAM, and floating gate/charge trap FLASH transistor Examines the design of the peripheral circuits including the sense amplifier and array-level organization for the memory array Examines industry trends of memory technologies such as FinFET based SRAM, High-Bandwidth-Memory (HBM), 3D NAND Flash, and 3D X-point array Discusses the prospects and challenges of emerging memory technologies such as PCM, RRAM, STT-MRAM/SOT-MRAM and FeRAM/FeFET Explores the new applications such as in-memory computing for AI hardware acceleration.
EUR 67,61
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New.
EUR 58,83
Quantità: 10 disponibili
Aggiungi al carrelloCondizione: New.
EUR 66,53
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Condizione: New. First edition Includes bibliographical references and index.
EUR 63,53
Quantità: 1 disponibili
Aggiungi al carrellopaperback. Condizione: New.
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 71,50
Quantità: 1 disponibili
Aggiungi al carrelloCondizione: New.
EUR 66,70
Quantità: 1 disponibili
Aggiungi al carrelloPaperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.
EUR 67,26
Quantità: 10 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Springer International Publishing AG, Cham, 2016
ISBN 10: 3031009029 ISBN 13: 9783031009020
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 52,33
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments andthe electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAMs potential novel applications beyond the NVM applications. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
EUR 76,97
Quantità: 3 disponibili
Aggiungi al carrelloCondizione: New.
Lingua: Inglese
Editore: Springer International Publishing, 2016
ISBN 10: 3031009029 ISBN 13: 9783031009020
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 29,95
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - RRAM technology has made significant progress in the past decade as a competitive candidate for the next generation non-volatile memory (NVM). This lecture is a comprehensive tutorial of metal oxide-based RRAM technology from device fabrication to array architecture design. State-of-the-art RRAM device performances, characterization, and modeling techniques are summarized, and the design considerations of the RRAM integration to large-scale array with peripheral circuits are discussed. Chapter 2 introduces the RRAM device fabrication techniques and methods to eliminate the forming process, and will show its scalability down to sub-10 nm regime. Then the device performances such as programming speed, variability control, and multi-level operation are presented, and finally the reliability issues such as cycling endurance and data retention are discussed. Chapter 3 discusses the RRAM physical mechanism, and the materials characterization techniques to observe the conductive filaments andthe electrical characterization techniques to study the electronic conduction processes. It also presents the numerical device modeling techniques for simulating the evolution of the conductive filaments as well as the compact device modeling techniques for circuit-level design. Chapter 4 discusses the two common RRAM array architectures for large-scale integration: one-transistor-one-resistor (1T1R) and cross-point architecture with selector. The write/read schemes are presented and the peripheral circuitry design considerations are discussed. Finally, a 3D integration approach is introduced for building ultra-high density RRAM array. Chapter 5 is a brief summary and will give an outlook for RRAM's potential novel applications beyond the NVM applications.
Condizione: New.
EUR 29,15
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Resistive Random Access Memory (RRAM) | Shimeng Yu | Taschenbuch | Synthesis Lectures on Emerging Engineering Technologies | vii | Englisch | 2016 | Springer | EAN 9783031009020 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.