Shin youngsoo editor (1 risultati)
VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers (IFIP Advances in Information and Communication Technology)
Shin, Youngsoo (Editor) / Tsui, Chi Ying (Editor) / Kim, Jae-Joon (Editor) / Choi, Kiyoung (Editor) / Reis, Ricardo (Editor)
Lingua: Inglese
Editore: Springer 2018
Serie: IFIP Advances in Information and Communication Technology, Libro 143 di 292. Libro 143 di 292 - IFIP Advances in Information and Communication Technology
- Brossura
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 86,02
EUR 11,59 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Paperback. Condizione: Brand New. rep rev edition. 240 pages. 9.25x6.10x0.63 inches. In Stock.
