Sonia ben dhia (22 risultati)

Condizione: New.

Condizione: New.

Condizione: As New. Unread book in perfect condition.

Condizione: As New. Unread book in perfect condition.

Condizione: New. In English.

Condizione: New. Editor(s): Dhia, Sonia Ben; Ramdani, Mohamed; Sicard, Etienne. Num Pages: 486 pages, biography. BIC Classification: TJF; TJFC; TJFN; TRC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 25. Weight in Grams: 741. . 2014. Paperback. . . . .

Taschenbuch. Condizione: Neu. Electromagnetic Compatibility of Integrated Circuits | Techniques for Low Emission and Susceptibility | Sonia Ben Dhia (u. a.) | Taschenbuch | xiii | Englisch | 2014 | Springer Us | EAN 9781461498315 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.…

Condizione: New. pp. 488.

Condizione: New. pp. 473.

Condizione: New. Editor(s): Dhia, Sonia Ben; Ramdani, Mohamed; Sicard, Etienne. Num Pages: 486 pages, biography. BIC Classification: TJF; TJFC; TJFN; TRC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 25. Weight in Grams: 741. . 2014. Paperback. . . . . Books ship from the US and Ireland.…

Condizione: new. Questo è un articolo print on demand.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. 488 pp. Englisch.…

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. 488 pp. Englisch.…

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers IC design, noise modeling and characterization, electromagnetism, packaging and EMC measurementsIncludes standardized measurement methods, standardized modeling approaches, and dedicated toolsElectromagnetic Compatibilit.…

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers IC design, noise modeling and characterization, electromagnetism, packaging and EMC measurementsIncludes standardized measurement methods, standardized modeling approaches, and dedicated toolsElectromagnetic Compatibilit.…

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.…

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuseson the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 488 pp. Englisch.…

Condizione: New. Print on Demand pp. 488 Illus.

Condizione: New. Print on Demand pp. 473.

Condizione: New. PRINT ON DEMAND pp. 473.

Condizione: New. PRINT ON DEMAND pp. 488.