Strong alvin w (17 risultati)

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condizione: New.

Condizione: New. pp. 624.

Condizione: New. pp. 624.

HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: new.

Condizione: New. pp. 624.

Condizione: New.

Condizione: New. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982. . 2009. 1st Edition. Hardcover. . . . .…

Condizione: New. In English.

Condizione: As New. Unread book in perfect condition.

Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Hardcover. Condizione: Brand New. 1st edition. 624 pages. 9.50x6.50x1.25 inches. In Stock.

Condizione: As New. Unread book in perfect condition.

Condizione: New. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982. . 2009. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Condizione: Brand New. 1st edition. 624 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.

Hardcover. Condizione: new. Hardcover. This invaluable resource tells the complete story of failure mechanismsfrom basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections. This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…