Toda yogesh (16 risultati)

Condizione: New.

Condizione: New.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Theoretical predictions for AlSb material properties have not been realized using bulk growth methods. This research was motivated by thermal evaporation technology to produce high quality thin film AlSb for the purpose of evaluating transport properties and suitability for thermo electric devices and solar cell. The objective of present research work is to prepare compound thin films of AlSb thin films for thermoelectric applications. The thin film of varying thicknesses of AlSb was prepared by using thermal vacuum evaporation technique. The structural characterizations were made by using XRD. The optical characterizations and band gap were evaluated using UV-VIS-NIR spectroscopy, Electrical Characterizations by four probe technique and thermoelectric characterizations were carried out. X-ray diffractogram shows that films were polycrystalline in nature and having cubic structure. The various parameters such as activation energy, bulk resistivity, carrier concentration, mobility, Fermi energy, absorption coefficient were evaluated and found to be thickness dependent. The deposited films were semiconducting in nature and a suitable candidate for IR detector, solar cell. 92 pp. Englisch.…

Condizione: New. Print on Demand.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Toda YogeshDr. Dhananjay Gujarathi is renowned Associate Professor and researcher in Physics. He has published various research papers and books on solar cell, crystal growth, thin films and optics in international and National Journ.…

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc. 164 pp. Englisch.…

Condizione: New. PRINT ON DEMAND.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Toda YogeshDr. Dhananjay Gujarathi is renowned Associate Professor and researcher in Physics. He has published various research papers and books on solar cell, crystal growth, thin films and optics in international and National Journ.…

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Theoretical predictions for AlSb material properties have not been realized using bulk growth methods. This research was motivated by thermal evaporation technology to produce high quality thin film AlSb for the purpose of evaluating transport properties and suitability for thermo electric devices and solar cell. The objective of present research work is to prepare compound thin films of AlSb thin films for thermoelectric applications. The thin film of varying thicknesses of AlSb was prepared by using thermal vacuum evaporation technique. The structural characterizations were made by using XRD. The optical characterizations and band gap were evaluated using UV-VIS-NIR spectroscopy, Electrical Characterizations by four probe technique and thermoelectric characterizations were carried out. X-ray diffractogram shows that films were polycrystalline in nature and having cubic structure. The various parameters such as activation energy, bulk resistivity, carrier concentration, mobility, Fermi energy, absorption coefficient were evaluated and found to be thickness dependent. The deposited films were semiconducting in nature and a suitable candidate for IR detector, solar cell.…

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Theoretical predictions for AlSb material properties have not been realized using bulk growth methods. This research was motivated by thermal evaporation technology to produce high quality thin film AlSb for the purpose of evaluating transport properties and suitability for thermo electric devices and solar cell. The objective of present research work is to prepare compound thin films of AlSb thin films for thermoelectric applications. The thin film of varying thicknesses of AlSb was prepared by using thermal vacuum evaporation technique. The structural characterizations were made by using XRD. The optical characterizations and band gap were evaluated using UV-VIS-NIR spectroscopy, Electrical Characterizations by four probe technique and thermoelectric characterizations were carried out. X-ray diffractogram shows that films were polycrystalline in nature and having cubic structure. The various parameters such as activation energy, bulk resistivity, carrier concentration, mobility, Fermi energy, absorption coefficient were evaluated and found to be thickness dependent. The deposited films were semiconducting in nature and a suitable candidate for IR detector, solar cell.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 92 pp. Englisch.…

Condizione: New. Print on Demand.

Taschenbuch. Condizione: Neu. The Investigation of Transport Properties in AlSb Thin Films | Yogesh Toda (u. a.) | Taschenbuch | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202683265 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu Print on Demand. …

Condizione: New. PRINT ON DEMAND.

Taschenbuch. Condizione: Neu. Thin Films | Study of Electronic and Optical Propertiesof Al1-xInxSb Thin Films | Yogesh Toda (u. a.) | Taschenbuch | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202793957 | Verantwortliche Person für die EU: LAP Lambert Academic Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu Print on Demand.…

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 164 pp. Englisch.…

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Success of any recent technology, nowadays, is possible only through the accomplishment of semiconductor science advancements. Advancement in any industry, for the past few decades has been based on semiconductor technology and semiconductor devices. The advancement in semiconductor technology necessitates the improvement of new semiconductor materials and the new processing techniques, both in bulk and thin film. The book entitled 'Study of Electronic and Optical Properties of Al1-xInxSb Thin Films' consist of measurement of electrical, thermo electrical and optical properties of Al1-xInxSb films deposited on glass substrate over thickness range of 1000 - 4000 Å by thermal evaporation technique. The properties measured are resistivity, Hall measurement, thermo electric power measurement, I-V characteristics, optical band gap and structural properties. From the data obtained, material parameters have been derived such as grain size, lattice parameters, bulk resistivity, mean free path, activation energy, carrier concentration, conduction type, band gap etc.…