Trzaska hubert (26 risultati)
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- Prima edizione
Da: Feldman's Books, Menlo Park, CA, U.S.A.Feldman's Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 53,02
EUR 3,86 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Very Fine. First Edition. No markings.
Lingua: Inglese
Editore: Scitech, NJ, 2014
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Da: Feldman's Books, Menlo Park, CA, U.S.A.Feldman's Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato
EUR 61,86
EUR 3,86 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: Very Fine. First Edition. No markings.
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Da: HPB-Red, Dallas, TX, U.S.A.HPB-Red
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Buono
EUR 66,29
EUR 3,22 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.
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Da: Books From California, Simi Valley, CA, U.S.A.Books From California
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 81,38
EUR 4,28 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Very Good.
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Da: Books From California, Simi Valley, CA, U.S.A.Books From California
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Ottimo
EUR 81,38
EUR 4,28 spedizioneSpedito in U.S.A.Quantità: 17 disponibili
Hardcover. Condizione: Fine.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 100,18
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 105,95
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
- Rilegato
Da: Rarewaves USA, HEBRON, KY, U.S.A.Rarewaves USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 108,29
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexte…rnal environmental factors that affect accuracycompetence and training of the instrument operator.
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Da: Rarewaves USA, HEBRON, KY, U.S.A.Rarewaves USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 108,47
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understa…nding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 94,15
EUR 17,50 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 97,97
EUR 13,98 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
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Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 122,38
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understa…nding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 121,78
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 111,17
EUR 17,50 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
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Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 111,73
EUR 17,50 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 102,13
EUR 29,16 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 132,89
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 127,67
EUR 17,50 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
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Da: Rarewaves USA United, HEBRON, KY, U.S.A.Rarewaves USA United
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 111,18
EUR 42,90 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; proper calibration of the measuring instrumentexte…rnal environmental factors that affect accuracycompetence and training of the instrument operator.
- Rilegato
Da: Rarewaves USA United, HEBRON, KY, U.S.A.Rarewaves USA United
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 111,37
EUR 42,90 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understa…nding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 145,64
EUR 11,67 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 201 pages. 9.00x6.00x0.75 inches. In Stock.
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 145,90
EUR 11,67 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 2nd revised edition edition. 230 pages. 9.09x6.10x0.71 inches. In Stock.
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Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 108,43
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Über den AutorrnrnPawel Bienkowski is affiliated with the EM Environment Protection Lab at the Technical University of Wroclaw, Poland where he researches electromagnetic compatibility and electromagnetic field measurements and standards.
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Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 110,55
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Über den AutorrnrnDr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Stan.
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Da: Rarewaves.com UK, London, Regno UnitoRarewaves.com UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 115,58
EUR 75,82 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. This book is devoted to the specific problems of electromagnetic field (EMF) measurements in the near field and to the analysis of the main factors which impede accuracy in these measurements. It focuses on careful and accurate design of systems to measure in the near field based on a thorough understa…nding of the fundamental engineering principles and on an analysis of the likely system errors. Beginning with a short introduction to electromagnetic fields with an emphasis on the near field, it then presents methods of EMF measurements in near field conditions. It details the factors limiting measurement accuracy including internal ones (thermal stability, frequency response, dynamic characteristics, susceptibility) and external ones (field integration, mutual couplings between a probe and primary and secondary EMF sources, directional pattern deformations). It continues with a discussion on how to gauge the parameters declared by an EMF meter manufacturer and simple methods for testing these parameters. It also details how designers of measuring equipment can reconsider the near field when designing and testing, as well as how users can exploit the knowledge within the book to ensure their tests and results contain the most accurate measurements possible. The SciTech Publishing Series on Electromagnetic Compatibility provides a continuously growing body of knowledge in the latest development and best practices in electromagnetic compatibility engineering. This series provides specialist and non-specialist professionals and students practical knowledge that is thoroughly grounded in relevant theory.
Lingua: Inglese
Editore: Institution Of Engineering & Technology Dez 2013, 2013
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 150,00
EUR 62,35 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Neuware - Electromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; - proper calibration of the measuring instru…ment - external environmental factors that affect accuracy - competence and training of the instrument operator.
