vanarajsinh solanki (58 risultati)

Paperback. Condizione: Brand New. 60 pages. 8.66x5.91x0.14 inches. In Stock.

Paperback. Condizione: Brand New. 60 pages. 8.66x5.91x0.14 inches. In Stock.

Condizione: New.

Condizione: New.

Taschenbuch. Condizione: Neu. Atomic Force Microscopy Fundamentals and Applications | Vanarajsinh Solanki (u. a.) | Taschenbuch | 60 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200247247 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Experimental Techniques for Material Characterization-Part-1 | Vanarajsinh Solanki (u. a.) | Taschenbuch | 60 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200254405 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Condizione: New.

Condizione: New.

Taschenbuch. Condizione: Neu. Techniques expérimentales pour la caractérisation des matériaux - Partie 1 | Vanarajsinh Solanki (u. a.) | Taschenbuch | Französisch | 2022 | Editions Notre Savoir | EAN 9786204761428 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Principes fondamentaux et applications de la microscopie à force atomique | Vanarajsinh Solanki (u. a.) | Taschenbuch | Französisch | 2022 | Editions Notre Savoir | EAN 9786204698045 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Condizione: New.

Condizione: New.

Taschenbuch. Condizione: Neu. Técnicas experimentais para caracterização de materiais - Parte-1 | Vanarajsinh Solanki (u. a.) | Taschenbuch | Portugiesisch | 2022 | Edições Nosso Conhecimento | EAN 9786204761442 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Fondamenti e applicazioni della microscopia a forza atomica | Vanarajsinh Solanki (u. a.) | Taschenbuch | Italienisch | 2022 | Edizioni Sapienza | EAN 9786204698052 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Fundamentos e Aplicações da Microscopia da Força Atómica | Vanarajsinh Solanki | Taschenbuch | Paperback | Portugiesisch | 2022 | Edições Nosso Conhecimento | EAN 9786204698083 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Tecniche sperimentali per la caratterizzazione dei materiali - Parte 1 | Vanarajsinh Solanki (u. a.) | Taschenbuch | Italienisch | 2022 | Edizioni Sapienza | EAN 9786204761435 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Experimentelle Techniken zur Materialcharakterisierung - Teil 1 | Vanarajsinh Solanki (u. a.) | Taschenbuch | 60 S. | Deutsch | 2022 | Verlag Unser Wissen | EAN 9786204761404 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Grundlagen und Anwendungen der Rasterkraftmikroskopie | Vanarajsinh Solanki | Taschenbuch | Paperback | 52 S. | Deutsch | 2022 | Verlag Unser Wissen | EAN 9786204698069 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners. 60 pp. Englisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples. 60 pp. Englisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Este libro se centra en diferentes herramientas de caracterización de materiales, centrándose en la morfología/topología y las propiedades estructurales de los materiales. En el capítulo relacionado con las herramientas de caracterización morfológica, el libro discute principalmente el Microscopio Electrónico de Transmisión (TEM), el Microscopio Electrónico de Barrido (SEM) y el Microscopio de Fuerza Atómica (AFM), mientras que el capítulo de caracterización estructural incluye los detalles del Difractómetro de Rayos X (XRD), la Difracción de Neutrones, el Microscopio Raman y la Di¿racción Electrónica de Área Seleccionada (SAED). En este capítulo, hemos hecho todo lo posible para explicar cada detalle de las técnicas experimentales, lo que será muy útil para los nuevos estudiantes. 60 pp. Spanisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Este libro se centra en el principio de funcionamiento del AFM, sus diferentes modos (es decir, modos de contacto, sin contacto y de golpeo), el análisis de algunos resultados del AFM y también algunas aplicaciones. Este libro también subraya las características del AFM como herramienta morfológica altamente versátil y útil para escanear una gran variedad de superficies, con una resolución plana que va desde las esclaes nanométricas hasta la escala atómica. Esperamos que este libro sea útil para que los investigadores y estudiantes comprendan el concepto básico del AFM y lo utilicen en diferentes tipos de muestras. 52 pp. Spanisch.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Solanki Dr. VanarajsinhDr. Vanaraj Solanki had earned his masters in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian Insti.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Solanki Dr. VanarajsinhDr. Vanaraj Solanki had earned his master(M.Sc) in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian .

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Ce livre se concentre sur les différents outils de caractérisation des matériaux en se focalisant sur la morphologie/topologie et les propriétés structurelles des matériaux. Dans le chapitre relatif aux outils de caractérisation morphologique, l'ouvrage traite principalement du microscope électronique à transmission (MET), du microscope électronique à balayage (MEB) et du microscope à force atomique (AFM), tandis que le chapitre sur la caractérisation structurelle comprend les détails du diffractomètre à rayons X (XRD), de la diffraction des neutrons, du microscope Raman et de la di raction électronique à aire sélectionnée (SAED). Nous avons fait de notre mieux pour expliquer chaque détail des techniques expérimentales, ce qui sera très utile aux nouveaux apprenants. 60 pp. Französisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Ce livre se concentre sur le principe de fonctionnement de l'AFM, ses différents modes (c'est-à-dire les modes contact, non contact et tapotement), l'analyse de certains résultats AFM et quelques applications également. Ce livre souligne également les caractéristiques de l'AFM en tant qu'outil morphologique très polyvalent et utile pour scanner une grande variété de surfaces, avec une résolution planaire allant du nano -mètre à l'échelle atomique. Nous espérons que ce livre pourra aider les chercheurs et les étudiants à comprendre le concept de base de l'AFM et à l'utiliser pour différents types d'échantillons. 52 pp. Französisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 60 pp. Englisch.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di¿raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 60 pp. Englisch.

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.

Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.