Winterfeldt martin (8 risultati)

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  • Lingua: Inglese

    Editore: Cuvillier, 2018

    3736997337 / 9783736997332

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    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Innovationen Mit Mikrowellen Und Licht 2018-03-06, 2018

    3736997337 / 9783736997332

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    Da: Chiron Media, Wallingford, Regno UnitoChiron Media

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    EUR 35,41

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    Quantità: 10 disponibili

    Paperback. Condizione: New.

  • Lingua: Inglese

    Editore: Cuvillier, 2018

    3736997337 / 9783736997332

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    PAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Lingua: Inglese

    Editore: Cuvillier, 2018

    3736997337 / 9783736997332

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    Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK

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  • Lingua: Inglese

    Editore: Cuvillier Mrz 2018, 2018

    3736997337 / 9783736997332

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 39,90

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern high-power broad area (BA) diode lasers are important building blocks for the materials processing industry, combining high optical output power with high conversion efficiency. However, their use in direct diode systems, e.g. for sheet metal cutting, is limited due to a poor lateral (slow-axis) beam quality, which is inversely proportional to the beam parameter product (BPP).The main objective of this work was therefore on root cause analy-sis of the factors influencing the diode lasers' increase in lateral BPP. Hence, a series of diagnostic experiments was conducted, each aiming at a specific potential influence in order to assess its importance. The list of considered effects includes thermal lens shape, epitaxial layer design, lateral carrier profile, process-induced index guiding via dry etched trenches, filamentation, and mechanical strain. Analysis revealed that epitaxial layer structure and chip geometry have considerable impact on thermal lens bowing, which directly correlates with the rate of BPP increase with rising junction temperature. In addition, the suppression of lateral carrier accumulation with deep proton implantation at the BA emitter edges led to a 33% decrease of that deterioration rate. The application of index guiding trenches yielded stabilized near-field dimensions as function of current, but also increased the BPP considerably. Filamentation and mechanical strain were found to have only marginal influence.In addition, this work assesses techniques that aim at reducing the BPP via a reduction of the number of active lateral modes. As a result of a near-field-width selective loss mechanism, diode lasers with an excellent linear radiance of 4.4 W/mm.mrad were fabricated. 158 pp. Englisch.

  • Lingua: Inglese

    Editore: Cuvillier, Cuvillier, 2018

    3736997337 / 9783736997332

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Modern high-power broad area (BA) diode lasers are important building blocks for the materials processing industry, combining high optical output power with high conversion efficiency. However, their use in direct diode systems, e.g. for sheet metal cutting, is limited due to a poor lateral (slow-axis) beam quality, which is inversely proportional to the beam parameter product (BPP).The main objective of this work was therefore on root cause analy-sis of the factors influencing the diode lasers' increase in lateral BPP. Hence, a series of diagnostic experiments was conducted, each aiming at a specific potential influence in order to assess its importance. The list of considered effects includes thermal lens shape, epitaxial layer design, lateral carrier profile, process-induced index guiding via dry etched trenches, filamentation, and mechanical strain. Analysis revealed that epitaxial layer structure and chip geometry have considerable impact on thermal lens bowing, which directly correlates with the rate of BPP increase with rising junction temperature. In addition, the suppression of lateral carrier accumulation with deep proton implantation at the BA emitter edges led to a 33% decrease of that deterioration rate. The application of index guiding trenches yielded stabilized near-field dimensions as function of current, but also increased the BPP considerably. Filamentation and mechanical strain were found to have only marginal influence.In addition, this work assesses techniques that aim at reducing the BPP via a reduction of the number of active lateral modes. As a result of a near-field-width selective loss mechanism, diode lasers with an excellent linear radiance of 4.4 W/mm.mrad were fabricated.

  • Lingua: Inglese

    Editore: Cuvillier, Cuvillier Mär 2018, 2018

    3736997337 / 9783736997332

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modern high-power broad area (BA) diode lasers are important building blocks for the materials processing industry, combining high optical output power with high conversion efficiency. However, their use in direct diode systems, e.g. for sheet metal cutting, is limited due to a poor lateral (slow-axis) beam quality, which is inversely proportional to the beam parameter product (BPP).The main objective of this work was therefore on root cause analy-sis of the factors influencing the diode lasers' increase in lateral BPP. Hence, a series of diagnostic experiments was conducted, each aiming at a specific potential influence in order to assess its importance. The list of considered effects includes thermal lens shape, epitaxial layer design, lateral carrier profile, process-induced index guiding via dry etched trenches, filamentation, and mechanical strain. Analysis revealed that epitaxial layer structure and chip geometry have considerable impact on thermal lens bowing, which directly correlates with the rate of BPP increase with rising junction temperature. In addition, the suppression of lateral carrier accumulation with deep proton implantation at the BA emitter edges led to a 33% decrease of that deterioration rate. The application of index guiding trenches yielded stabilized near-field dimensions as function of current, but also increased the BPP considerably. Filamentation and mechanical strain were found to have only marginal influence.In addition, this work assesses techniques that aim at reducing the BPP via a reduction of the number of active lateral modes. As a result of a near-field-width selective loss mechanism, diode lasers with an excellent linear radiance of 4.4 W/mm.mrad were fabricated.Books on Demand GmbH, Überseering 33, 22297 Hamburg 158 pp. Englisch.

  • Lingua: Inglese

    Editore: Cuvillier, 2018

    3736997337 / 9783736997332

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    Da: preigu, Osnabrück, Germaniapreigu

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    EUR 39,90

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    Quantità: 5 disponibili

    Taschenbuch. Condizione: Neu. Investigation of slow-axis beam quality degradation in high-power broad area diode lasers | Martin Winterfeldt | Taschenbuch | Innovationen mit Mikrowellen und Licht. Forschungsberichte aus dem Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik 43 | 158 S. | Englisch | 2018 | Cuvillier | EAN 9783736997332 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu Print on Demand.