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  • Lingua: Inglese

    Editore: Singapore, Springer, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato

    Da: Antiquariat Bookfarm, Löbnitz, GermaniaAntiquariat Bookfarm

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    Condizione: Usato - Molto buono

    EUR 17,00

    EUR 40,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibili

    Hardcover. Condizione: Gut. VII, 508. 333 illus., 26 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02774 9789811304538 Sprache: Englisch Gewicht in Gramm: 1150.

  • Lingua: Inglese

    Editore: Springer Nature Singapore, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

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    Da: Buchpark, Trebbin, GermaniaBuchpark

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    Condizione: Usato

    EUR 17,61

    EUR 105,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 4 disponibili

    Condizione: Hervorragend. Zustand: Hervorragend | Seiten: 516 | Sprache: Englisch | Produktart: Bücher | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…

  • Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura

    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    Condizione: Nuovo

    EUR 141,25

    EUR 13,13 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. In English.

  • Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

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    Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle

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    Condizione: Nuovo

    EUR 150,78

    EUR 3,50 spedizione 
    Spedito in U.S.A.

    Quantità: 4 disponibili

    Condizione: New. pp. 515 Softcover reprint of the original 1st ed. 2018 edition NO-PA16APR2015-KAP.

  • Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura

    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Condizione: Nuovo

    EUR 135,02

    EUR 35,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibili

    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…

  • Altre immagini

    Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

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    Da: preigu, Osnabrück, Germaniapreigu

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    Condizione: Nuovo

    EUR 108,70

    EUR 70,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 5 disponibili

    Taschenbuch. Condizione: Neu. Progress in Nanoscale Characterization and Manipulation | Rongming Wang (u. a.) | Taschenbuch | Springer Tracts in Modern Physics | vii | Englisch | 2019 | Springer | EAN 9789811344206 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Lingua: Inglese

    Editore: Springer, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato

    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    Condizione: Nuovo

    EUR 195,28

    EUR 17,37 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. In English.

  • Condizione: Nuovo

    EUR 257,20

    EUR 14,53 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 2 disponibili

    Hardcover. Condizione: Brand New. 508 pages. 9.25x6.25x1.75 inches. In Stock.

  • Lingua: Inglese

    Editore: Springer, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato

    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    Condizione: Nuovo

    EUR 252,70

    EUR 29,07 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 1 disponibili

    Hardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer Nature Singapore Jan 2019, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura
    • Print on Demand

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Condizione: Nuovo

    EUR 123,04

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Singapore, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

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    Condizione: Nuovo

    EUR 105,45

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.…

  • Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura
    • Print on Demand

    Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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    Condizione: Nuovo

    EUR 155,49

    EUR 7,56 spedizione 
    Spedito da Regno Unito a U.S.A.

    Quantità: 4 disponibili

    Condizione: New. Print on Demand pp. 515.

  • Lingua: Inglese

    Editore: Springer, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura
    • Print on Demand

    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    Condizione: Nuovo

    EUR 154,65

    EUR 9,95 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 4 disponibili

    Condizione: New. PRINT ON DEMAND pp. 515.

  • Lingua: Inglese

    Editore: Springer, Springer Jan 2019, 2019

    9811344205 / 9789811344206

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Brossura
    • Print on Demand

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 123,04

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibili

    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Singapore, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato
    • Print on Demand

    Da: moluna, Greven, Germaniamoluna

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    Condizione: Nuovo

    EUR 144,94

    EUR 48,99 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: Più di 20 disponibili

    Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.…

  • Lingua: Inglese

    Editore: Springer Nature Singapore Sep 2018, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato
    • Print on Demand

    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    Condizione: Nuovo

    EUR 171,19

    EUR 23,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 2 disponibili

    Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.…

  • Lingua: Inglese

    Editore: Palgrave Macmillan, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

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    • Print on Demand

    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Condizione: Nuovo

    EUR 185,59

    EUR 35,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibili

    Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…

  • Lingua: Inglese

    Editore: Springer, Springer Sep 2018, 2018

    981130453X / 9789811304538

    Serie: Libro 213 di 227 - Springer Tracts in Modern Physics

    • Rilegato
    • Print on Demand

    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    Condizione: Nuovo

    EUR 171,19

    EUR 60,00 spedizione 
    Spedito da Germania a U.S.A.

    Quantità: 1 disponibili

    Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.…