Xuedong bai (18 risultati)

Lingua: Inglese
Editore: Singapore, Springer, 2018
- Rilegato
Da: Antiquariat Bookfarm, Löbnitz, GermaniaAntiquariat Bookfarm
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 17,00
EUR 40,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Gut. VII, 508. 333 illus., 26 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02774 9789811304538 Sprache: Englisch Gewicht in Gramm: 1150.

Lingua: Inglese
Editore: Springer Nature Singapore, 2018
- Rilegato
Da: Buchpark, Trebbin, GermaniaBuchpark
Contatta il venditoreVenditore con 5 stelleCondizione: Usato
EUR 17,61
EUR 105,00 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: Hervorragend. Zustand: Hervorragend | Seiten: 516 | Sprache: Englisch | Produktart: Bücher | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…

Lingua: Inglese
Editore: Springer, 2019
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 141,25
EUR 13,13 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In English.

Lingua: Inglese
Editore: Springer, 2019
- Brossura
Da: Books Puddle, Woodside, NY, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 150,78
EUR 3,50 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. pp. 515 Softcover reprint of the original 1st ed. 2018 edition NO-PA16APR2015-KAP.

Lingua: Inglese
Editore: Springer, 2019
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 135,02
EUR 35,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…
Altre immaginiLingua: Inglese
Editore: Springer, 2019
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 108,70
EUR 70,00 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Taschenbuch. Condizione: Neu. Progress in Nanoscale Characterization and Manipulation | Rongming Wang (u. a.) | Taschenbuch | Springer Tracts in Modern Physics | vii | Englisch | 2019 | Springer | EAN 9789811344206 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Lingua: Inglese
Editore: Springer, 2018
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 195,28
EUR 17,37 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In English.

Lingua: Inglese
Editore: Springer Verlag, 2018
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 257,20
EUR 14,53 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 508 pages. 9.25x6.25x1.75 inches. In Stock.

Lingua: Inglese
Editore: Springer, 2018
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 252,70
EUR 29,07 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Lingua: Inglese
Editore: Springer Nature Singapore Jan 2019, 2019
- Brossura
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 123,04
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.…

Progress in Nanoscale Characterization and Manipulation
Wang, Rongming|Wang, Chen|Zhang, Hongzhou|Tao, Jing|Bai, Xuedong
Lingua: Inglese
Editore: Springer Singapore, 2019
- Brossura
- Print on Demand
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 105,45
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.…

Lingua: Inglese
Editore: Springer, 2019
- Brossura
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 155,49
EUR 7,56 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Condizione: New. Print on Demand pp. 515.

Lingua: Inglese
Editore: Springer, 2019
- Brossura
- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 154,65
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: New. PRINT ON DEMAND pp. 515.

Lingua: Inglese
Editore: Springer, Springer Jan 2019, 2019
- Brossura
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 123,04
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.…

Progress in Nanoscale Characterization and Manipulation
Wang, Rongming|Wang, Chen|Zhang, Hongzhou|Tao, Jing|Bai, Xuedong
Lingua: Inglese
Editore: Springer Singapore, 2018
- Rilegato
- Print on Demand
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 144,94
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.…

Lingua: Inglese
Editore: Springer Nature Singapore Sep 2018, 2018
- Rilegato
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 171,19
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.…

Lingua: Inglese
Editore: Palgrave Macmillan, 2018
- Rilegato
- Print on Demand
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 185,59
EUR 35,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.…

Lingua: Inglese
Editore: Springer, Springer Sep 2018, 2018
- Rilegato
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 171,19
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.…