Springer japan sep 1998 (2 risultati)
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 158,29
EUR 63,27 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Neuware - Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and stor…age, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.
- Brossura
- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 85,55
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HRE…M for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM. 204 pp. Englisch.
