High-Resolution Electron Microscopy for Materials Science - Brossura

Shindo, Daisuke

Brossura

ISBN 10: 4431702342 ISBN 13: 9784431702344

Casa editrice: Springer, 2013

Riassunto

High-resolution electron microscopy (H.R.E.M.) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of H.R.E.M. for materials science.

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Contenuti

1. Basis of High-Resolution Electron Microscopy.- 1.1 Principles of Transmission Electron Microscopy.- 1.2 Electron Scattering and Fourier Transform.- 1.3 Formation of High-Resolution Images.- 1.3.1 High-Resolution Images of Thin Crystals.- 1.3.2 Resolution of Electron Microscopes.- 1.3.3 High-Resolution Images of Thick Crystals.- 1.4 Computer Simulation of High-Resolution Images.- 1.4.1 Simulation Program and Input Parameters.- 1.4.2 Generalization of Image Simulation.- 1.4.3 Checking Programs.- References.- 2. Practice of High-Resolution Electron Microscopy.- 2.1 Classification of High-Resolution Images.- 2.1.1 Lattice Fringes.- 2.1.2 One-Dimensional Structure Images.- 2.1.3 Two-Dimensional Lattice Images.- 2.1.4 Two-Dimensional Structure Images.- 2.1.5 Special Images.- 2.2 Practice in Observing High-Resolution Images.- 2.2.1 Points to Note Before Observation.- 2.2.2 Points to Note During Observation.- 2.2.3 Selection of Good Images.- 2.2.4 Points to Note in the Interpretation of Images.- 2.2.5 Training for the Observation of High-Resolution Images.- References.- 3. Application of High-Resolution Electron Microscopy.- 3.1 High-Resolution Images of Various Defects.- 3.1.1 Dislocations.- 3.1.2 Grain Boundaries and Interfaces Between Different Phases.- 3.1.3 Surfaces.- 3.1.4 Other Structural Defects.- 3.2 High-Resolution Images of Various Materials.- 3.2.1 Ceramics.- 3.2.2 Superconducting Oxides.- 3.2.3 Ordered Alloys.- 3.2.4 Quasicrystals.- References.- 4. Peripheral Instruments and Techniques for High-Resolution Electron Microscopy.- 4.1 Image Processing.- 4.1.1 Input and Output of High-Resolution Images.- 4.1.2 Practice in Processing High-Resolution Images.- 4.2 Quantitative Analysis.- 4.2.1 Principles of New Recording Systems.- 4.2.2 Characteristics of New Recording Systems.- 4.2.3 Quantitative High-Resolution Electron Microscopy.- 4.3 Electron Diffraction.- 4.3.1 Basis of Electron Diffraction.- 4.3.2 Practice of Electron Diffraction.- 4.3.3 Electron Diffraction Patterns of Various Structures.- 4.4 Weak-Beam Method.- 4.4.1 Principles of the Weak-Beam Method.- 4.4.2 Weak-Beam Method in Practice.- 4.5 Evaluation of the Performance of Electron Microscopes.- 4.5.1 Evaluation of Basic Parameters in Electron Microscopes.- 4.5.2 Evaluation of the Resolution of Electron Microscopes.- 4.6 Specimen Preparation Techniques.- 4.6.1 Crushing.- 4.6.2 Electropolishing.- 4.6.3 Chemical Polishing.- 4.6.4 Ultramicrotomy.- 4.6.5 Ion Milling.- 4.6.6 Focused Ion Beam (FIB).- 4.6.7 Vacuum Evaporation.- References.- Appendixes.- Appendix A. Physical Constants, Conversion Factors and Electron Wavelength.- Appendix B. Geometry of Crystal Lattice.- Appendix C. Typical Structures in Materials and Their Electron Diffraction Patterns.- Appendix D. Properties of Fourier Transform.- Appendix E. Sign Conventions.

Dettagli dell'edizione

• Editore: Springer
• Data di pubblicazione: 2013
• Lingua: Inglese
• ISBN 10: 4431702342
• ISBN 13: 9784431702344
• Rilegatura: Copertina flessibile
• Numero di pagine: 204
• Contatto del produttore: non disponibile
• Persona responsabile: Springer Nature Customer Service Center GmbH; ProductSafety@springernature.com; ; Europaplatz 3; Heidelberg; 69115; Germania