Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 75,48
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Da: GreatBookPrices, Columbia, MD, U.S.A.
EUR 82,19
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Da: Majestic Books, Hounslow, Regno Unito
EUR 76,75
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Da: California Books, Miami, FL, U.S.A.
EUR 84,68
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Da: Books Puddle, New York, NY, U.S.A.
Condizione: New. 1st edition NO-PA16APR2015-KAP.
Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 75,82
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Da: GreatBookPricesUK, Woodford Green, Regno Unito
EUR 76,63
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Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 75,83
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Aggiungi al carrelloPaperback / softback. Condizione: New. New copy - Usually dispatched within 4 working days.
Da: Revaluation Books, Exeter, Regno Unito
EUR 111,67
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 406 pages. 9.18x6.12x9.21 inches. In Stock.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 82,01
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Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 89,68
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Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Lingua: Inglese
Editore: Taylor & Francis Ltd, London, 2024
ISBN 10: 0367635887 ISBN 13: 9780367635886
Da: CitiRetail, Stevenage, Regno Unito
EUR 95,48
Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime.Describes how to use the developed methods of analytical predictive modeling to minimize thermal stresses and strains in solder joint of IC devicesShows how to build the preprocessing models in finite-element analyses (FEA) by comparing the FEA and analytical dataCovers how to design the most effective test vehicles for testing solder jointsDetails how to design and organize, in addition to or sometimes even instead of highly accelerated life tests (HALT), highly focused and highly cost-effective failure oriented accelerated testing (FOAT) to understand the physic of failure of solder joint interconnectionsOutlines how to convert the low cycle fatigue conditions into elastic fatigue conditions and to assess the fatigue lifetime in such casesIllustrates ways to replace time- and labor-consuming, expensive, and possibly misleading temperature cycling tests with simpler and physically meaningful accelerated testsThis book is aimed towards professionals in electronic and photonic packaging, electronic and optical materials, materials engineering, and mechanical design. The book addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Da: preigu, Osnabrück, Germania
EUR 95,70
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices | Ephraim Suhir | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | CRC Press | EAN 9780367635886 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 114,33
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The book addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime.