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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 236,84
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Lingua: Inglese
Editore: Elsevier Science Publishing Co Inc, US, 2023
ISBN 10: 0443193266 ISBN 13: 9780443193262
Da: Rarewaves.com USA, London, LONDO, Regno Unito
EUR 285,50
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Aggiungi al carrelloHardback. Condizione: New. Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
EUR 275,74
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Aggiungi al carrelloCondizione: New. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics Redaktion: Peter W. HawkesPeter H.
Lingua: Inglese
Editore: Elsevier Science Publishing Co Inc, US, 2023
ISBN 10: 0443193266 ISBN 13: 9780443193262
Da: Rarewaves.com UK, London, Regno Unito
EUR 269,75
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Aggiungi al carrelloHardback. Condizione: New. Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Lingua: Inglese
Editore: Elsevier Science Publishing Co Inc Mär 2023, 2023
ISBN 10: 0443193266 ISBN 13: 9780443193262
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 387,60
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Da: Brook Bookstore On Demand, Napoli, NA, Italia
EUR 169,63
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Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
Da: Revaluation Books, Exeter, Regno Unito
EUR 221,50
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Aggiungi al carrelloHardcover. Condizione: Brand New. 232 pages. 9.00x6.00x0.69 inches. In Stock. This item is printed on demand.