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Lingua: Inglese
Editore: Dover Publications 7/7/2006, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Paperback or Softback. Condizione: New. A User's Guide to Ellipsometry. Book.
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Lingua: Inglese
Editore: Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Paperback. Condizione: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Aggiungi al carrelloSoftcover. Condizione: Fine. Leichte Kratzer / Abnutzungen / Druckstellen; Leichte Rillen / Abschürfungen / Risse / Knicke. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 14 case studies illustrate concepts and applications. Three appendices provide helpful references. 1993 edition.
Da: Revaluation Books, Exeter, Regno Unito
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Aggiungi al carrelloPaperback. Condizione: Brand New. 260 pages. 8.25x5.25x0.50 inches. In Stock.
Lingua: Inglese
Editore: Dover Publications Inc. 2009-01-01, 2009
ISBN 10: 0486450287 ISBN 13: 9780486450285
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Da: moluna, Greven, Germania
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Aggiungi al carrelloCondizione: New. Inhaltsverzeichnisrnrn1. Theoretical Aspectsn2. Instrumentationn3. Using Optical Parameters to Determine Material Propertiesn4. Determining Optical Parameters for Inaccessible Substrates and Unknown Filmsn5. Extremely Thin Filmsn6. The Spe.
paperback. Condizione: New. In shrink wrap. Looks like an interesting title!
Lingua: Inglese
Editore: Dover Publications Jul 2006, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Da: AHA-BUCH GmbH, Einbeck, Germania
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware - Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition.
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
EUR 18,46
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Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Lingua: Inglese
Editore: Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 22,91
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Aggiungi al carrelloPaperback. Condizione: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Lingua: Inglese
Editore: Dover Publications Inc., New York, 2006
ISBN 10: 0486450287 ISBN 13: 9780486450285
Da: CitiRetail, Stevenage, Regno Unito
EUR 22,66
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Aggiungi al carrelloPaperback. Condizione: new. Paperback. This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry - particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth.A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references. Text for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. 1993 edition. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.