ISBN: 9780780310629 - digital systems testing and testable design (32 risultati)

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Condizione: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.…

HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: New.

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Condizione: New.

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Condizione: New. pp. 672.

Condizione: New. pp. 672.

Hardback. Condizione: New. 1st. This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.…

Condizione: New. Num Pages: 672 pages, illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XV) Technical / Manuals. Dimension: 271 x 187 x 40. Weight in Grams: 1338. . 1994. 1st Edition. Hardcover. . . . .

Condizione: New. In English.

Condizione: New. &Uumlber den AutorMiron Abramovici is a Distinguished Member of the Technical Staff at AT&ampT Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago. Melvi.

Hardcover. Condizione: Brand New. revised edition. 653 pages. 10.50x7.25x1.50 inches. In Stock.

Condizione: New. Num Pages: 672 pages, illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XV) Technical / Manuals. Dimension: 271 x 187 x 40. Weight in Grams: 1338. . 1994. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. …

Hardback. Condizione: New. 1st. This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.…

Buch. Condizione: Neu. Neuware - This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.…