9780792359401 - Impact of Electron and Scanning Probe Microscopy on Materials Research: 364 di Valdr??, Giovanni; Rickerby, David G.; Valdr??, Ugo (12 risultati)

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Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E:. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . .

Taschenbuch. Condizione: Neu. Impact of Electron and Scanning Probe Microscopy on Materials Research | David G. Rickerby (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 1999 | Springer | EAN 9780792359401 | Verantwortliche Person für die EU: Springer Nature Customer Service Center GmbH, Europaplatz 3, 69115 Heidelberg, productsafety[at]springernature[dot]com | Anbieter: preigu.

Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E:. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . Books ship from the US and Ireland.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc. 516 pp. Englisch.

Kartoniert / Broschiert. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplin.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.