Isbn: 9780792390039 - wafer scale integration (11 risultati)

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    • Lingua: Inglese

      Editore: Springer, 1989

      0792390032 / 9780792390039

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      Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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      EUR 227,64

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      Condizione: New. In English.

    • Lingua: Inglese

      Editore: Kluwer Academic Publishers, 1989

      0792390032 / 9780792390039

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      Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.

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      Condizione: New. Editor(s): Swartzlander, Earl E. Num Pages: 503 pages, black & white illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 28. Weight in Grams: 912. . 1989. Hardback. . . . .

    • Lingua: Inglese

      Editore: Springer, 1989

      0792390032 / 9780792390039

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      Da: Books Puddle, New York, NY, U.S.A.Books Puddle

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      Condizione: New. pp. 528.

    • Lingua: Inglese

      Editore: Kluwer Academic Publishers, 1989

      0792390032 / 9780792390039

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      Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore

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      Condizione: New. Editor(s): Swartzlander, Earl E. Num Pages: 503 pages, black & white illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 28. Weight in Grams: 912. . 1989. Hardback. . . . . Books ship from the US and Ireland.

    • Lingua: Inglese

      Editore: Springer, 1989

      0792390032 / 9780792390039

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      Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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      Condizione: Usato - Come nuovo

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      Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

    • Lingua: Inglese

      Editore: Springer US, 1989

      0792390032 / 9780792390039

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      Da: preigu, Osnabrück, Germaniapreigu

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      EUR 186,70

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      Buch. Condizione: Neu. Wafer Scale Integration | Earl E. Swartzlander Jr. | Buch | xx | Englisch | 1989 | Springer US | EAN 9780792390039 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

    • Lingua: Inglese

      Editore: Springer US, Springer New York Mär 1989, 1989

      0792390032 / 9780792390039

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      Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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      EUR 213,99

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      Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Wafer Scale Integration (WSI) is the culmination of the quest for larger integrated circuits. In VLSI chips are developed by fabricating a wafer with hundreds of identical circuits, testing the circuits, dicing the wafer, and packaging the good dice. In contrast in WSI, a wafer is fabricated with several types of circuits (generally referred to as cells), with multiple instances of each cell type, the cells are tested, and good cells are interconnected to realize a system on the wafer. Since most signal lines stay on the wafer, stray capacitance is low, so that high speeds are achieved with low power consumption. For the same technology a WSI implementation may be a factor of five faster, dissipate a factor of ten less power, and require one hundredth to one thousandth the volume. Successful development of WSI involves many overlapping disciplines, ranging from architecture to test design to fabrication (including laser linking and cutting, multiple levels of interconnection, and packaging). This book concentrates on the areas that are unique to WSI and that are as a result not well covered by any of the many books on VLSI design. A unique aspect of WSI is that the finished circuits are so large that there will be defects in some portions of the circuit. Accordingly much attention must be devoted to designing architectures that facilitate fault detection and reconfiguration to of WSI include fabrication circumvent the faults. Other unique aspects technology and packaging.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 528 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, 1989

      0792390032 / 9780792390039

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      Da: Majestic Books, Hounslow, Regno UnitoMajestic Books

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      EUR 291,48

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      Condizione: New. Print on Demand pp. 528 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

    • Lingua: Inglese

      Editore: Springer US Mrz 1989, 1989

      0792390032 / 9780792390039

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      Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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      Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Wafer Scale Integration (WSI) is the culmination of the quest for larger integrated circuits. In VLSI chips are developed by fabricating a wafer with hundreds of identical circuits, testing the circuits, dicing the wafer, and packaging the good dice. In contrast in WSI, a wafer is fabricated with several types of circuits (generally referred to as cells), with multiple instances of each cell type, the cells are tested, and good cells are interconnected to realize a system on the wafer. Since most signal lines stay on the wafer, stray capacitance is low, so that high speeds are achieved with low power consumption. For the same technology a WSI implementation may be a factor of five faster, dissipate a factor of ten less power, and require one hundredth to one thousandth the volume. Successful development of WSI involves many overlapping disciplines, ranging from architecture to test design to fabrication (including laser linking and cutting, multiple levels of interconnection, and packaging). This book concentrates on the areas that are unique to WSI and that are as a result not well covered by any of the many books on VLSI design. A unique aspect of WSI is that the finished circuits are so large that there will be defects in some portions of the circuit. Accordingly much attention must be devoted to designing architectures that facilitate fault detection and reconfiguration to of WSI include fabrication circumvent the faults. Other unique aspects technology and packaging. 528 pp. Englisch.

    • Lingua: Inglese

      Editore: Springer, 1989

      0792390032 / 9780792390039

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      Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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      EUR 298,43

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      Condizione: New. PRINT ON DEMAND pp. 528.

    • Lingua: Inglese

      Editore: Humana, 1989

      0792390032 / 9780792390039

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      Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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      EUR 316,62

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      Buch. Condizione: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Wafer Scale Integration (WSI) is the culmination of the quest for larger integrated circuits. In VLSI chips are developed by fabricating a wafer with hundreds of identical circuits, testing the circuits, dicing the wafer, and packaging the good dice. In contrast in WSI, a wafer is fabricated with several types of circuits (generally referred to as cells), with multiple instances of each cell type, the cells are tested, and good cells are interconnected to realize a system on the wafer. Since most signal lines stay on the wafer, stray capacitance is low, so that high speeds are achieved with low power consumption. For the same technology a WSI implementation may be a factor of five faster, dissipate a factor of ten less power, and require one hundredth to one thousandth the volume. Successful development of WSI involves many overlapping disciplines, ranging from architecture to test design to fabrication (including laser linking and cutting, multiple levels of interconnection, and packaging). This book concentrates on the areas that are unique to WSI and that are as a result not well covered by any of the many books on VLSI design. A unique aspect of WSI is that the finished circuits are so large that there will be defects in some portions of the circuit. Accordingly much attention must be devoted to designing architectures that facilitate fault detection and reconfiguration to of WSI include fabrication circumvent the faults. Other unique aspects technology and packaging.