Hardcover. Condizione: Very Good. Hardcover; fading and light shelf wear to exterior; light fading to page edges; otherwise in very good condition with clean text, firm binding.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 165,70
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Condizione: New. pp. 308.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 1989
ISBN 10: 0792390547 ISBN 13: 9780792390541
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
EUR 201,60
Quantità: 15 disponibili
Aggiungi al carrelloCondizione: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 292 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 609. . 1989. Hardback. . . . .
EUR 180,97
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Aggiungi al carrelloGebunden. Condizione: New. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac.
Lingua: Inglese
Editore: Kluwer Academic Publishers, 1989
ISBN 10: 0792390547 ISBN 13: 9780792390541
Da: Kennys Bookstore, Olney, MD, U.S.A.
Condizione: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 292 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 609. . 1989. Hardback. . . . . Books ship from the US and Ireland.
EUR 222,67
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as 'design for manufacture' or 'statistical design'. As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.
Da: Majestic Books, Hounslow, Regno Unito
EUR 228,21
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 308 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 226,00
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 308.