9780852743980 - yield modelling and defect tolerance in vlsi, papers presented at the int workshop on designing for yield, 1-3 july 1987, oxford di moore, will; maly, wojciech (2 risultati)

Condizione: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Ship…