Isbn: 9781032246802 - fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists (17 risultati)

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PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000.

Condizione: New. pages cm 1st edition Includes bibliographical references and index.

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Paperback. Condizione: New. The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. …

Paperback. Condizione: Brand New. 272 pages. 9.18x6.12x9.21 inches. In Stock.

Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Paperback. Condizione: new. Paperback. The structureproperty relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the authors course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…

Paperback. Condizione: new. Paperback. The structureproperty relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the authors course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Paperback. Condizione: new. Paperback. The structureproperty relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the authors course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.…