Quality and reliability engineering - 9781118700235 - next generation halt and hass: robust design of electronics and systems di gray, kirk a.; paschkewitz, john j. (23 risultati)
Next Generation HALT and HASS: Robust Design of Electronics and Systems (Quality and Reliability Eng
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: Wrigley Books, Austin, TX, U.S.A.Wrigley Books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Molto buono
EUR 57,22
EUR 2,15 spedizioneSpedito in U.S.A.Quantità: 1 disponibili
hardcover. Condizione: very good. Used items may not include media like access codes or CDs. Fast shipping! Expedited orders take 1-3 business days! Media mail may take up to 5 business days.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 90,68
EUR 5,84 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 15 disponibili
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 97,07
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 90,99
EUR 6,80 spedizioneSpedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Condizione: new.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 103,65
EUR 2,27 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 93,69
EUR 13,94 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In English.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 90,67
EUR 17,46 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Lingua: Inglese
Editore: John Wiley and Sons Inc, US, 2016
- Rilegato
Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 119,11
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Thi…s is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 105,02
EUR 17,46 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: As New. Unread book in perfect condition.
Lingua: Inglese
Editore: John Wiley & Sons, 2016
- Rilegato
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 116,65
EUR 7,56 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 3 disponibili
Condizione: New. pp. 300.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
Da: THE SAINT BOOKSTORE, Southport, Regno UnitoTHE SAINT BOOKSTORE
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 107,14
EUR 18,71 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. New copy - Usually dispatched within 4 working days.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: California Books, Miami, FL, U.S.A.California Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 126,82
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
- Prima edizione
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 116,38
EUR 9,50 spedizioneSpedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Series: Quality and Reliability Engineering Series. Num Pages: 280 pages. BIC Classification: TGPR; TJF. Category: (P) Professional & Vocational. Dimension…: 229 x 152. . . 2016. 1st Edition. Hardcover. . . . .
Lingua: Inglese
Editore: John Wiley & Sons, 2016
- Rilegato
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 129,01
EUR 3,44 spedizioneSpedito in U.S.A.Quantità: 3 disponibili
Condizione: New. pp. 300.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 145,52
EUR 9,04 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Series: Quality and Reliability Engineering Series. Num Pages: 280 pages. BIC Classification: TGPR; TJF. Category: (P) Professional & Vocational. Dimension…: 229 x 152. . . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Lingua: Inglese
Editore: John Wiley & Sons, 2016
- Rilegato
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 104,09
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Kirk A. Gray, Accelerated Reliability Solutions, L.L.C., Colorado, USAKirk Gray has over 33 years of experience in the electronics manufacturing industry. He began his career in electronics in semiconductor manufacturing equipment and progressing to validat.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 155,91
EUR 11,64 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 1st edition. 296 pages. 9.00x6.25x0.75 inches. In Stock.
Lingua: Inglese
Editore: John Wiley and Sons Inc, US, 2016
- Rilegato
Da: Rarewaves.com UK, London, Regno UnitoRarewaves.com UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 115,87
EUR 75,65 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. Thi…s is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.
Lingua: Inglese
Editore: John Wiley & Sons, 2016
- Rilegato
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 184,90
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: New.
Lingua: Inglese
Editore: Wiley, 2016
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
Contatta il venditoreVenditore con 4 stelleCondizione: Usato - Come nuovo
EUR 212,17
EUR 29,10 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
- Print on Demand
Da: THE SAINT BOOKSTORE, Southport, Regno UnitoTHE SAINT BOOKSTORE
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 107,22
EUR 18,71 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Hardback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 533.
Lingua: Inglese
Editore: John Wiley & Sons Inc, 2016
- Rilegato
- Print on Demand
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 125,62
EUR 11,64 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 1st edition. 296 pages. 9.00x6.25x0.75 inches. In Stock. This item is printed on demand.
Lingua: Inglese
Editore: John Wiley & Sons Inc, New York, 2016
- Rilegato
- Prima edizione
- Print on Demand
Da: CitiRetail, Stevenage, Regno UnitoCitiRetail
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 101,27
EUR 43,06 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliabilit…y risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. The book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. The physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardwaresoftware interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. Key features: Provides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.Challenges existing failure prediction methodologies by highlighting their limitations using real field data.Explains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.Presents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.Guides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.Integrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process. Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
