9781402032073 - introduction to advanced system-on-chip test design and optimization: problems, modelling, design and optimization: 29 di larsson, erik (11 risultati)
Lingua: Inglese
Editore: Springer, 2005
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Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germaniabooks4less (Versandantiquariat Petra Gros GmbH & Co. KG)
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EUR 23,95
EUR 15,95 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
gebundene Ausgabe. Condizione: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechen…d gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860.
Lingua: Inglese
Editore: Springer-Verlag, Netherlands, 2005
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- Prima edizione
Da: J. W. Mah, Burnaby, BC, CanadaJ. W. Mah
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EUR 90,64
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Hardcover. Condizione: Near Fine. Condizione sovraccoperta: No Dust Jacket as Published. 1st. (NETH) Presumed 1st edition Ownership stamp to top edge of pages, small ownerhsip label to the back of the cover, no other markings, Near Fine; no dust jacket as published. Hardcover, 388pp, index, diagrams. This book gives an introduct…ion to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. (2.5 JM 0426 LVR Size: 8vo - over 7¾" - 9¾".
Lingua: Inglese
Editore: Springer, 2005
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 165,53
EUR 13,97 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
Lingua: Inglese
Editore: Springer, 2005
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 211,07
EUR 3,44 spedizioneSpedito in U.S.A.Quantità: 4 disponibili
Condizione: New. pp. 412.
Lingua: Inglese
Editore: Springer US, Springer US, 2005
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 168,73
EUR 63,88 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the impl…ementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Lingua: Inglese
Editore: Springer, 2005
- Rilegato
Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 258,19
EUR 29,15 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer US Nov 2005, 2005
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granular…ity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. 408 pp. Englisch.
Lingua: Inglese
Editore: Springer US, 2005
- Rilegato
- Print on Demand
Da: moluna, Greven, Germaniamoluna
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EUR 136,16
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System perspective to SOC test design. Overview of test problems and their modelingTest scheduling overview, extensive reference list Applicable for Master students and PhD-students working in the test field. Could a…lso be good for research.
Lingua: Inglese
Editore: Springer US, Copernicus Nov 2005, 2005
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 160,49
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity…and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 408 pp. Englisch.
Lingua: Inglese
Editore: Springer, 2005
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- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 220,60
EUR 7,58 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Condizione: New. Print on Demand pp. 412 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Lingua: Inglese
Editore: Springer, 2005
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- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
Contatta il venditoreVenditore con 4 stelleCondizione: Nuovo
EUR 224,90
EUR 9,95 spedizioneSpedito da Germania a U.S.A.Quantità: 4 disponibili
Condizione: New. PRINT ON DEMAND pp. 412.
