Articoli correlati a Introduction to Advanced System-on-chip Test Design...
Introduction to Advanced System-on-chip Test Design And Optimization: Problems, Modelling, Design And Optimization: 29 - Rilegato
Sinossi
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Le informazioni nella sezione "Riassunto" possono far riferimento a edizioni diverse di questo titolo.
Informazioni sull?autore
Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies
Le informazioni nella sezione "Su questo libro" possono far riferimento a edizioni diverse di questo titolo.
Compra nuovo
Visualizza questo articolo
EUR 136,16
EUR 9,70 per la spedizione da Germania a Italia
Destinazione, tempi e costi
Risultati della ricerca per Introduction to Advanced System-on-chip Test Design...
Immagini fornite dal venditore
Introduction to Advanced System-on-Chip Test Design and Optimization.
Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
Valutazione del venditore 5 su 5 stelle
gebundene Ausgabe. Condizione: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860. Codice articolo 1593690
Quantità: 1 disponibili
Foto dell'editore
INTRODUCTION TO ADVANCED SYSTEM-ON-CHIP TEST DESIGN AND OPTIMIZATION
Editore:
Springer-Verlag, Netherlands, 2005
ISBN 10: 1402032072
ISBN 13: 9781402032073
Antico o usato
Rilegato
Prima edizione
Da: J. W. Mah, Burnaby, BC, Canada
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Near Fine. Condizione sovraccoperta: No Dust Jacket. 1st. (NETH) Presumed 1st edition Ownership stamp to top edge of pages, small ownerhsip label to the back of the cover, no other markings, Near Fine; no dust jacket as published. Hardcover, 388pp, index, diagrams. This book gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. (2.5 JM 0322 Size: 8vo - over 7¾" - 9¾". Codice articolo 07175
Quantità: 1 disponibili
Immagini fornite dal venditore
Introduction to Advanced System-on-Chip Test Design and Optimization
Print on DemandDa: moluna, Greven, Germania
Valutazione del venditore 5 su 5 stelle
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System perspective to SOC test design. Overview of test problems and their modelingTest scheduling overview, extensive reference list Applicable for Master students and PhD-students working in the test field. Could also be good for research. Codice articolo 4093246
Quantità: Più di 20 disponibili
Immagini fornite dal venditore
Introduction to Advanced System-on-Chip Test Design and Optimization
Print on DemandDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. 408 pp. Englisch. Codice articolo 9781402032073
Quantità: 2 disponibili
Immagini fornite dal venditore
Introduction to Advanced System-on-Chip Test Design and Optimization
Editore:
Springer US, Springer US Nov 2005, 2005
ISBN 10: 1402032072
ISBN 13: 9781402032073
Nuovo
Rilegato
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. Neuware -SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 408 pp. Englisch. Codice articolo 9781402032073
Quantità: 2 disponibili
Foto dell'editore
Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
Condizione: New. In. Codice articolo ria9781402032073_new
Quantità: Più di 20 disponibili
Immagini fornite dal venditore
Introduction to Advanced System-on-Chip Test Design and Optimization
Da: AHA-BUCH GmbH, Einbeck, Germania
Valutazione del venditore 5 su 5 stelle
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Codice articolo 9781402032073
Quantità: 1 disponibili
Foto dell'editore
Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing, 29)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. Codice articolo ABLIING23Mar2411530142700
Quantità: Più di 20 disponibili