9781461360049 - testability concepts for digital ics: the macro test approach: 3 di beenker, f.p.m.; bennetts, r.g.; thijssen, a.p. (10 risultati)
Lingua: Inglese
Editore: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Condizione: New. pp. 228.
Lingua: Inglese
Editore: Springer US, Springer New York 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how t…o create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
Lingua: Inglese
Editore: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Paperback. Condizione: Like New. Like New. book.
Lingua: Inglese
Editore: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: Brook Bookstore On Demand, Napoli, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
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Editore: Springer US, Springer New York Okt 2012 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, kn…owledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models. 228 pp. Englisch.
Lingua: Inglese
Editore: Springer US 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: moluna, Greven, Germaniamoluna
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Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styl…es. Thirdly, knowledge of how to create a.
Lingua: Inglese
Editore: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. Print on Demand pp. 228 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
Lingua: Inglese
Editore: Springer US, Humana Okt 2012 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: buchversandmimpf2000, Emtmannsberg, Germaniabuchversandmimpf2000
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowle…dge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 228 pp. Englisch.
Lingua: Inglese
Editore: Springer 2012
Serie: Frontiers in Electronic Testing, Libro 1 di 40. Libro 1 di 40 - Frontiers in Electronic Testing
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Da: Biblios, frankfurt am main, GermaniaBiblios
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Condizione: New. PRINT ON DEMAND pp. 228.
