9781489989390 - atom probe microscopy: 160 di gault, baptiste; moody, michael p.; cairney, julie m.; ringer, simon p. (9 risultati)
Atom Probe Microscopy (Springer Series in Materials Science, 160)
Gault, Baptiste; Moody, Michael P.; Cairney, Julie M.; Ringer, Simon P.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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Condizione: New. In.
Lingua: Inglese
Editore: Springer New York, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: moluna, Greven, Germaniamoluna
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Condizione: New.
Altre immaginiLingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: preigu, Osnabrück, Germaniapreigu
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Taschenbuch. Condizione: Neu. Atom Probe Microscopy | Baptiste Gault (u. a.) | Taschenbuch | Springer Series in Materials Science | xxiv | Englisch | 2014 | Springer | EAN 9781489989390 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbie…ter: preigu.
Lingua: Inglese
Editore: Springer, Humana, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the… development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condizione: New. pp. 422.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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Condizione: New. pp. 422.
Lingua: Inglese
Editore: Springer, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
- Print on Demand
Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand
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Condizione: new. Questo è un articolo print on demand.
Lingua: Inglese
Editore: Springer, Humana Jun 2014, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
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Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last… decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. 420 pp. Englisch.
Lingua: Inglese
Editore: Springer, Humana Jun 2014, 2014
Serie: Springer Series in Materials Science, Libro 39 di 233. Libro 39 di 233 - Springer Series in Materials Science
- Brossura
- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
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EUR 299,59
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Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last dec…ade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument¿s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy¿including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 420 pp. Englisch.
