9781848219366 - nanometer-scale defect detection using polarized light di dahoo, pierre richard; pougnet, philippe; el hami, abdelkhalak (19 risultati)
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Rilegato
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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EUR 151,24
EUR 2,31 spedizioneSpedito in U.S.A.Quantità: 8 disponibili
Condizione: As New. Unread book in perfect condition.
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Da: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
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EUR 154,54
Spedizione gratuitaSpedito in U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light a…nalysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Rilegato
Da: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 152,17
EUR 2,31 spedizioneSpedito in U.S.A.Quantità: 8 disponibili
Condizione: New.
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
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Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 161,43
EUR 7,65 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Condizione: New.
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Da: PBShop.store UK, Fairford, GLOS, Regno UnitoPBShop.store UK
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EUR 167,76
EUR 5,91 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
HRD. Condizione: New. New Book. Shipped from UK. Established seller since 2000.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Come nuovo
EUR 158,53
EUR 17,66 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 8 disponibili
Condizione: As New. Unread book in perfect condition.
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Da: Rarewaves.com USA, London, LONDO, Regno UnitoRarewaves.com USA
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 184,16
Spedizione gratuitaSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardback. Condizione: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with… techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Rilegato
Da: GreatBookPricesUK, Woodford Green, Regno UnitoGreatBookPricesUK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 167,75
EUR 17,66 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 8 disponibili
Condizione: New.
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Da: Chiron Media, Wallingford, Regno UnitoChiron Media
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EUR 177,27
EUR 18,24 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: New.
Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Dahoo, Pierre-Richard; Pougnet, Philippe; El Hami, Abdelkhalak
- Rilegato
Da: Ubiquity Trade, Miami, FL, U.S.A.Ubiquity Trade
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EUR 193,19
EUR 2,62 spedizioneSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New. Brand new! Please provide a physical shipping address.
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Da: THE SAINT BOOKSTORE, Southport, Regno UnitoTHE SAINT BOOKSTORE
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EUR 178,70
EUR 19,94 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardback. Condizione: New. New copy - Usually dispatched within 4 working days.
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- Prima edizione
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrlandaKennys Bookshop and Art Galleries Ltd.
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 183,03
EUR 10,50 spedizioneSpedito da Irlanda a U.S.A.Quantità: 15 disponibili
Condizione: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN;…TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . .
Nanometer-Scale Defect Detection Using Polarized Light
Dahoo, Pierre-Richard|Pougnet, Philippe|El Hami, Abdelkhalak
- Rilegato
Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 166,43
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.Klappentext.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard/ Pougnet, Philippe/ El Hami, Abdelkhalak
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 222,34
EUR 14,72 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock.
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Da: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 229,73
EUR 9,17 spedizioneSpedito in U.S.A.Quantità: 15 disponibili
Condizione: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN;…TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
- Rilegato
Da: Rarewaves.com UK, London, Regno UnitoRarewaves.com UK
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 174,94
EUR 76,54 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardback. Condizione: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with… techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
- Rilegato
Da: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 265,13
EUR 32,33 spedizioneSpedito da Australia a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: new. Hardcover. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light a…nalysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 231,75
EUR 63,21 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. Neuware - This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
Nanometer-scale Defect Detection Using Polarized Light
Dahoo, Pierre Richard/ Pougnet, Philippe/ El Hami, Abdelkhalak
- Rilegato
- Print on Demand
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 211,61
EUR 14,72 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 2 disponibili
Hardcover. Condizione: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock. This item is printed on demand.
