Isbn: 9783319756868 - kelvin probe force microscopy: from single charge detection to device characterization: 65 (13 risultati)

Condizione: New. In English.

Hardcover. Condizione: gut. 2018. Springer Series in Surface Sciences - 65: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization In deutscher Sprache. pages.

Hardcover. Condizione: Gut. xxiv, 521 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16212 9783319756868 Sprache: Englisch Gewicht in Gramm: 1050.

Condizione: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. …

Hardcover. Condizione: Brand New. 521 pages. 9.50x6.25x1.25 inches. In Stock.

Hardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Condizione: new. Questo è un articolo print on demand.

Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Discusses the applications of Kelvin probe force microscopy in nanotechnologyProvides a detailed description of a variety of theoretical and experimental aspects of the techniqueIncludes contributions by leading experts in the field.…

Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field. 548 pp. Englisch.…

Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents the applications of Kelvin probe force microscopy in nanotechnologyProvides an in-depth description of a variety of theoretical and experimental aspects of the techniqueIncludes contributions by the leading experts in the fieldSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 548 pp. Englisch.…

Condizione: New. Print on Demand.

Condizione: New. PRINT ON DEMAND.