9783527349517 - introduction to spectroscopic ellipsometry of thin film materials: instrumentation, data analysis, and applications di wee, andrew t. s.; yin, xinmao; tang, chi sin (4 risultati)
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Da: Bookbot, Prague, Repubblica CecaBookbot
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Ottimo
EUR 65,09
EUR 20,99 spedizioneSpedito da Repubblica Ceca a U.S.A.Quantità: 1 disponibili
Softcover. Condizione: Fine. Abnutzung / Risse - leicht; Vergilbt / ausgeblichen. A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Instrumentation, Data Analysis and Applications , a team of eminen…t researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book Perfect for master's- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
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Da: moluna, Greven, Germaniamoluna
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 102,00
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: 5 disponibili
Condizione: New. Andrew T. S. Wee is a class of 62 Professor of Physics, and Director of the Surface Science Laboratory at the National University of Singapore (NUS). His research interests are in surface and nanoscale science, scanning tunnelling microscopy (STM) and synch.
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Da: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermaniaBUCHSERVICE / ANTIQUARIAT Lars Lutzer
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 189,90
EUR 39,95 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Condizione: gut. 2022. Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications In deutscher Sprache. pages.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 101,49
EUR 14,03 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
