9783540418184 - high-resolution imaging on spectrometry of materials: 50 (11 risultati)
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Da: Research Ink, Takoma Park, MD, U.S.A.Research Ink
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EUR 53,58
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Hardcover. Condizione: Very Good. xiv + 440 pp. Springer series in materials science, 50. Rubber-stamped on front free endpaper. book.
Lingua: Inglese
Editore: Springer Verlag, 2002
Serie: Libro 60 di 233 - Springer Series in Materials Science
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Da: CSG Onlinebuch GMBH, Darmstadt, GermaniaCSG Onlinebuch GMBH
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EUR 46,75
EUR 95,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Gebunden. Condizione: Gut. Gebraucht - Gut Zustand: Gut, Mängelexemplar, XIV, 440 p. 211 illus., 32 in color About this book: This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and…interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students. Written for researchers.
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 165,92
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Condizione: New. In.
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Da: California Books, Miami, FL, U.S.A.California Books
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EUR 180,38
Spedizione gratuitaSpedito in U.S.A.Quantità: Più di 20 disponibili
Condizione: New.
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Lingua: Inglese
Editore: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2002
Serie: Libro 60 di 233 - Springer Series in Materials Science
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 160,49
EUR 64,68 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this charact…erisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
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Da: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
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EUR 230,99
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hardcover. Condizione: New. In shrink wrap. Looks like an interesting title.
Lingua: Inglese
Editore: Springer Verlag, 2003
Serie: Libro 60 di 233 - Springer Series in Materials Science
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 240,02
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Hardcover. Condizione: Brand New. 440 pages. 9.25x6.25x0.75 inches. In Stock.
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Lingua: Inglese
Editore: Springer Berlin Heidelberg Dez 2002, 2002
Serie: Libro 60 di 233 - Springer Series in Materials Science
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 160,49
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Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their componen…ts, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. 460 pp. Englisch.
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Lingua: Inglese
Editore: Springer Berlin Heidelberg, 2002
Serie: Libro 60 di 233 - Springer Series in Materials Science
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- Print on Demand
Da: moluna, Greven, Germaniamoluna
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EUR 136,16
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Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In contrast to previously available books this not only reports on the state of the art of advanced electron microscopy but also contains examples of applicationsThe characterisation of materials and materi…al systems is an essential aspect of materials .
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Lingua: Inglese
Editore: Springer, Springer Berlin Heidelberg Dez 2002, 2002
Serie: Libro 60 di 233 - Springer Series in Materials Science
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 160,49
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components,…this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at 'critical' regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 460 pp. Englisch.
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Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 345,98
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Condizione: New. Print on Demand pp. 460.
