9783866449657 - OCM 2013 - Optical Characterization of Materials : Conference Proceedings di Beyerer, Juergen (11 risultati)

Condizione: New. In.

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Taschenbuch. Condizione: Neu. Neuware -The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy. 296 pp. Deutsch.

Taschenbuch. Condizione: Neu. Neuware -The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

Taschenbuch. Condizione: Neu. OCM 2013 - Optical Characterization of Materials - conference proceedings | Fernando Puente León | Taschenbuch | Kartoniert / Broschiert | Deutsch | 2014 | Karlsruher Institut für Technologie | EAN 9783866449657 | Verantwortliche Person für die EU: Karlsruher Institut für Technologie (KIT), Institut AIFB, Kaiserstr. 89, 76133 Karlsruhe, verlag[at]aifb[dot]uni-karlsruhe[dot]de | Anbieter: preigu.

Taschenbuch. Condizione: Neu. Neuware -The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy. 296 pp. Deutsch.

Paperback. Condizione: Brand New. 296 pages. 8.27x5.83x0.70 inches. In Stock. This item is printed on demand.

Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy. 296 pp. Deutsch.

Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications.

Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy. 296 pp. Deutsch.