9787516040607 - rietveld refinement of x-ray polycrystalline diffraction data and an introduction to gsas software(chinese edition) di zheng zhen huan chen yu long (1 risultati)
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Da: liu xing, Nanjing, JS, Cinaliu xing
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
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EUR 15,77 spedizioneSpedito da Cina a U.S.A.Quantità: 1 disponibili
paperback. Condizione: New. Language:Chinese.Paperback. Pub Date: 2024-03 Publisher: China Building Materials Industry Press The full spectrum fitting of the Rietveld method has become an important method for X-ray polycrystalline diffraction to correct crystal structure. This book consists of four chapters. focusing on introduc…ing the principles of the Rietveld method and the basic process of refinement from operational examples. Chapter 1 briefly introduces the development overview and basic principles of the Rietveld.
