Isbn: 9789048178766 - new methods of concurrent checking: 42 (13 risultati)

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  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH

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    Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. …

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Condizione: New. pp. 192.

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections

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    Condizione: New. In English.

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    Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Taschenbuch. Condizione: Neu. New Methods of Concurrent Checking | Michael Gössel (u. a.) | Taschenbuch | viii | Englisch | 2010 | Springer | EAN 9789048178766 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books

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    EUR 187,13

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    Paperback. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: Brook Bookstore On Demand, Napoli, NA, ItaliaBrook Bookstore On Demand

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    Condizione: new. Questo è un articolo print on demand.

  • Lingua: Inglese

    Editore: Springer Netherlands Okt 2010, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.

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    EUR 106,99

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    Taschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected. 192 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer Netherlands, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Of great importance for the emerging nanotechnologies with their increasing numbers of transient faultsShows in a systematic way how the best possible state-of-the-art digital error detection circuits can be designedThe only book which desc.…

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    EUR 162,28

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    Condizione: New. Print on Demand pp. 192 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Lingua: Inglese

    Editore: Springer, Springer Okt 2010, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000

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    EUR 106,99

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    Taschenbuch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Internet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation. Computers are incredibly fast, inexpensive and equipped with almost unimag- able large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be 2 easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm . This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nano-technologies in the near future. Can we always trust computers Are computers always reliable Are chips suf- ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by c- current checking Besides permanent faults, many temporary or transient faults are also to be expected.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 192 pp. Englisch.…

  • Lingua: Inglese

    Editore: Springer, 2010

    9048178762 / 9789048178766

    Serie: Libro 20 di 40 - Frontiers in Electronic Testing

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    Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios

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    EUR 160,37

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    Condizione: New. PRINT ON DEMAND pp. 192.