Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 101,83
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Da: California Books, Miami, FL, U.S.A.
EUR 125,94
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 111,51
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Da: moluna, Greven, Germania
EUR 92,27
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Da: Revaluation Books, Exeter, Regno Unito
EUR 149,43
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 217 pages. 9.25x6.10x0.56 inches. In Stock.
Lingua: Inglese
Editore: Springer Nature Singapore, Springer Nature Singapore Jul 2017, 2017
ISBN 10: 9811010722 ISBN 13: 9789811010729
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 106,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 220 pp. Englisch.
Lingua: Inglese
Editore: Springer Nature Singapore, Springer Nature Singapore, 2017
ISBN 10: 9811010722 ISBN 13: 9789811010729
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 111,53
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 178,56
Quantità: 1 disponibili
Aggiungi al carrelloHardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer Nature Singapore Jul 2017, 2017
ISBN 10: 9811010722 ISBN 13: 9789811010729
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 106,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. 220 pp. Englisch.
Da: preigu, Osnabrück, Germania
EUR 95,70
Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip | Anupam Chattopadhyay (u. a.) | Buch | xx | Englisch | 2017 | Springer Singapore | EAN 9789811010729 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Da: Majestic Books, Hounslow, Regno Unito
EUR 189,14
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 201,18
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.