9789811304538 - progress in nanoscale characterization and manipulation: 272 di wang (9 risultati)
Lingua: Inglese
Editore: Singapore, Springer, 2018
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Da: Antiquariat Bookfarm, Löbnitz, GermaniaAntiquariat Bookfarm
Contatta il venditoreVenditore con 5 stelleCondizione: Usato - Molto buono
EUR 17,00
EUR 40,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: Gut. VII, 508. 333 illus., 26 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02774 9789811304538 Sprache: Englisch Gewicht in Gramm: 1150.
Lingua: Inglese
Editore: Springer Nature Singapore, 2018
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Da: Buchpark, Trebbin, GermaniaBuchpark
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EUR 17,61
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Condizione: Hervorragend. Zustand: Hervorragend | Seiten: 516 | Sprache: Englisch | Produktart: Bücher | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and micro…analysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Lingua: Inglese
Editore: Springer, 2018
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Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 178,04
EUR 13,98 spedizioneSpedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Condizione: New. In.
Lingua: Inglese
Editore: Springer, Springer, 2018
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Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 179,61
EUR 64,67 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their… crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Lingua: Inglese
Editore: Springer Verlag, 2018
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Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 250,39
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Hardcover. Condizione: Brand New. 508 pages. 9.25x6.25x1.75 inches. In Stock.
Lingua: Inglese
Editore: Springer, 2018
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Da: Mispah books, Redhill, SURRE, Regno UnitoMispah books
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EUR 253,69
EUR 29,18 spedizioneSpedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Hardcover. Condizione: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Lingua: Inglese
Editore: Springer Nature Singapore Sep 2018, 2018
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- Print on Demand
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermaniaBuchWeltWeit Ludwig Meier e.K.
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EUR 171,19
EUR 23,00 spedizioneSpedito da Germania a U.S.A.Quantità: 2 disponibili
Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and… examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.
Progress in Nanoscale Characterization and Manipulation
Wang, Rongming|Wang, Chen|Zhang, Hongzhou|Tao, Jing|Bai, Xuedong
Lingua: Inglese
Editore: Springer Singapore, 2018
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- Print on Demand
Da: moluna, Greven, Germaniamoluna
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EUR 144,94
EUR 48,99 spedizioneSpedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in s…canning electron mic.
Lingua: Inglese
Editore: Springer, Springer Sep 2018, 2018
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- Print on Demand
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germaniabuchversandmimpf2000
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 171,19
EUR 60,00 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron microscopy, transmi…ssion electron microscopy and helium ion microscopyExplores the growing opportunities in this field and introduces readers to state-of-the-art charged-particle microscopy techniquesSpringer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 516 pp. Englisch.
