Advances electronic testing challenges (13 risultati)
Lingua: Inglese
Editore: Springer, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
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Da: Basi6 International, Irving, TX, U.S.A.Basi6 International
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EUR 106,00
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Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Lingua: Inglese
Editore: Springer, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
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Da: Antiquariaat Ovidius, Bredevoort, Paesi BassiAntiquariaat Ovidius
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Condizione: Gebraucht / Used. Fine state d582e.
Lingua: Inglese
Editore: Springer US, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
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Da: Buchpark, Trebbin, GermaniaBuchpark
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Condizione: Sehr gut. Zustand: Sehr gut | Seiten: 440 | Sprache: Englisch | Produktart: Bücher | Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive ela…boration on important topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today¿s state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey. The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments. Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects. "There is a definite need for documenting the advances in testing ¿ I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [¿] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [¿] This latest addition to the Frontiers Series is destined to serve an important role." From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
Lingua: Inglese
Editore: Springer, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 167,05
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Condizione: New. In.
Altre immaginiLingua: Inglese
Editore: Springer US, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
Da: preigu, Osnabrück, Germaniapreigu
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EUR 140,10
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Taschenbuch. Condizione: Neu. Advances in Electronic Testing | Challenges and Methodologies | Dimitris Gizopoulos | Taschenbuch | xxv | Englisch | 2014 | Springer US | EAN 9781489987730 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbie…ter: preigu.
Lingua: Inglese
Editore: Springer, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
Da: Books Puddle, New York, NY, U.S.A.Books Puddle
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EUR 219,43
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Condizione: New. pp. 412.
Lingua: Inglese
Editore: Springer US, Springer US, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
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EUR 168,73
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Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on im…portant topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today's state of the art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing . I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [.] the book provides, besidesnovel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [.] This latest addition to the Frontiers Series is destined to serve an important role.' From the Foreword by Vishwani D. Agrawal, Consulting Editor, Frontiers in Electronic Testing Book Series.
Lingua: Inglese
Editore: Springer US, Copernicus, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: AHA-BUCH GmbH, Einbeck, GermaniaAHA-BUCH GmbH
Contatta il venditoreVenditore con 5 stelleCondizione: Nuovo
EUR 168,73
EUR 64,52 spedizioneSpedito da Germania a U.S.A.Quantità: 1 disponibili
Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important… topics which capture major research and development efforts today. The motivation and inspiration behind this book is to deliver a thorough text that focuses on the evolution of test technology, provides insight about the abiding importance of discussed topics, records today s state-of-the-art and industrial practices and trends, reveals the challenges for emerging testing methodologies, and envisages the future of this journey.The book consists of eleven edited chapters written by experts in Defect-Oriented Testing, Nanometer Technologies Failures and Testing, Silicon Debug, Delay Testing, High-Speed Test Interfaces, DFT-Oriented Low-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mexico Univ., Sandia National Labs, Synopsys, Teradyne and Texas Instruments.Advances in Electronic Testing: Challenges and Methodologies is an advanced textbook and reference point for senior undergraduate and graduate students in MSc or PhD tracks, professors and research leaders in the electronic testing domain. It is also for industry design and test engineers and managers seeking a global view and understanding of test technology practices and methodologies and a dense elaboration on test-related issues they face in their development projects.'There is a definite need for documenting the advances in testing I find the work of this edited volume by Dimitris Gizopoulos and his team of authors to be significant and timely. [ ]the book provides, besides novel test methodologies, a collective insight into the emerging aspects of testing. This, I think, is beneficial to practicing engineers and researchers both of whom must stay at the forefront of technology. [ ]This latest addition to the Frontiers Series is destined to serve an important role.'From the Foreword by Vishwani D. Agrawal, Consulting EditorFrontiers in Electronic Testing Book Series.
Lingua: Inglese
Editore: Springer, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Ria Christie Collections, Uxbridge, Regno UnitoRia Christie Collections
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EUR 229,09
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Condizione: New. In.
Lingua: Inglese
Editore: Springer Verlag, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
Da: Revaluation Books, Exeter, Regno UnitoRevaluation Books
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EUR 242,41
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Hardcover. Condizione: Brand New. 412 pages. 9.75x6.50x0.75 inches. In Stock.
Altre immaginiLingua: Inglese
Editore: Copernicus, 2006
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Rilegato
- Print on Demand
Da: preigu, Osnabrück, Germaniapreigu
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EUR 141,20
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Buch. Condizione: Neu. Advances in Electronic Testing | Challenges and Methodologies | Dimitris Gizopoulos | Buch | xxv | Englisch | 2006 | Copernicus | EAN 9780387294087 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Pri…nt on Demand.
Lingua: Inglese
Editore: Springer, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
- Print on Demand
Da: Majestic Books, Hounslow, Regno UnitoMajestic Books
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EUR 232,36
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Condizione: New. Print on Demand pp. 412.
Lingua: Inglese
Editore: Springer, 2014
Serie: Frontiers in Electronic Testing, Libro 6 di 40. Libro 6 di 40 - Frontiers in Electronic Testing
- Brossura
- Print on Demand
Da: Biblios, frankfurt am main, HESSE, GermaniaBiblios
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EUR 230,96
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Condizione: New. PRINT ON DEMAND pp. 412.
