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analog mixed signal boundary scan guide (20 risultati)
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
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Hardcover. Condizione: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 0.85.
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Hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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EUR 135,92
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Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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EUR 114,38
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Ships from Regno Unito to U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,500grams, ISBN:9780792386865.
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
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EUR 157,62
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Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard
Da: GreatBookPrices, Columbia, MD, U.S.A.
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Condizione: New.
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 16)
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
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EUR 157,96
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 158,35
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 16)
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 158,35
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Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 158,34
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 16)
Da: California Books, Miami, FL, U.S.A.
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EUR 178,74
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EUR 141,30
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Analog and Mixed-Signal Boundary-Scan | A Guide to the IEEE 1149.4 Test Standard | Adam Osseiran | Taschenbuch | xviii | Englisch | 2010 | Springer US | EAN 9781441951151 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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EUR 173,55
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Aggiungi al carrelloGebunden. Condizione: New. Adam Osseiran is Professor of Electrical Engineering at the Engineering Institute of Geneva, Switzerland and the European Design and Test Specialist at Fluence Technology Inc., Beaverton, Oregon, USA. He is the present Chair of the IEEE 1149.4 Work.
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EUR 165,03
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
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Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 220,48
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Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing (16))
Da: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 211,06
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Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
Da: Revaluation Books, Exeter, Regno Unito
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EUR 230,14
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Aggiungi al carrelloPaperback. Condizione: Brand New. 176 pages. 9.21x6.14x0.40 inches. In Stock.
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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard
Da: Revaluation Books, Exeter, Regno Unito
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EUR 232,12
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Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 155 pages. 9.25x6.25x0.75 inches. In Stock.
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Analog and Mixed-Signal Boundary-Scan : A Guide to the IEEE 1149.4 Test Standard
Da: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: As New. Unread book in perfect condition.
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EUR 241,87
EUR 62,13 shipping
Ships from Germania to U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.
