Importo totale (1 articolo articoli):
Destinazione ordine:
data mining diagnosing fails di huisman leendert (30 risultati)
Vai alla pagina principale dei risultati di ricerca
Filtri di ricerca
Tipo di articolo
- Tutti i tipi di prodotto
- Libri (30)
- Riviste e Giornali (Nessun altro risultato corrispondente a questo perfezionamento)
- Fumetti (Nessun altro risultato corrispondente a questo perfezionamento)
- Spartiti (Nessun altro risultato corrispondente a questo perfezionamento)
- Arte, Stampe e Poster (Nessun altro risultato corrispondente a questo perfezionamento)
- Fotografie (Nessun altro risultato corrispondente a questo perfezionamento)
- Mappe (Nessun altro risultato corrispondente a questo perfezionamento)
- Manoscritti e Collezionismo cartaceo (Nessun altro risultato corrispondente a questo perfezionamento)
Condizioni Maggiori informazioni
- Nuovo (24)
- Come nuovo, Ottimo o Quasi ottimo (5)
- Molto buono o Buono (Nessun altro risultato corrispondente a questo perfezionamento)
- Discreto o Mediocre (Nessun altro risultato corrispondente a questo perfezionamento)
- Come descritto (1)
Legatura
Ulteriori caratteristiche
- Prima ed. (Nessun altro risultato corrispondente a questo perfezionamento)
- Copia autograf. (Nessun altro risultato corrispondente a questo perfezionamento)
- Sovracoperta (Nessun altro risultato corrispondente a questo perfezionamento)
- Con foto (17)
- Non Print on Demand (25)
Lingua (1)
Spedizione gratuita
Paese del venditore
Valutazione venditore
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: Basi6 International, Irving, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Condizione: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
-
Data Mining and Diagnosing IC Fails.
Libro 15 di 40: Frontiers in Electronic TestingEditore: New York/ NY, Springer US., 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Lingua: Inglese
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
Membro dell'associazione: GIAQ ILAB VDA
Valutazione del venditore 5 su 5 stelle
EUR 16,00
EUR 30,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrello2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingEUR 49,62
Gratis per la spedizione da Australia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Valutazione del venditore 5 su 5 stelle
Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingEUR 87,68
Gratis per la spedizione da Australia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Data Mining and Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 104,75
EUR 2,28 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 104,75
EUR 2,28 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingDa: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 103,56
EUR 3,45 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingDa: Lucky's Textbooks, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 103,56
EUR 3,45 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 122,47
EUR 2,28 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 123,88
EUR 17,03 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining and Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 124,65
EUR 17,03 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
-
Data Mining And Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 128,91
EUR 17,03 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 133,45
EUR 13,60 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingDa: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 133,45
EUR 13,60 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
-
EUR 94,05
EUR 70,00 per la spedizione da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Data Mining and Diagnosing IC Fails | Leendert M Huisman | Taschenbuch | xx | Englisch | 2010 | Springer Us | EAN 9781441937674 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)
Libro 15 di 40: Frontiers in Electronic TestingDa: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 154,66
EUR 14,19 per la spedizione da Regno Unito a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 1st edition. 270 pages. 9.25x6.25x0.75 inches. In Stock.
-
Data Mining and Diagnosing IC Fails
Libro 15 di 40: Frontiers in Electronic TestingEditore: Springer US, Springer New York Jun 2005, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
Valutazione del venditore 5 su 5 stelle
EUR 106,99
EUR 60,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
-
EUR 111,35
EUR 61,93 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.
-
Data Mining and Diagnosing IC Fails
Libro 15 di 40: Frontiers in Electronic TestingEditore: Springer US, Springer New York, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Lingua: Inglese
EUR 114,36
EUR 62,88 per la spedizione da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
-
Data Mining and Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPricesUK, Woodford Green, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 169,54
EUR 17,03 per la spedizione da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Libro 15 di 40: Frontiers in Electronic TestingDa: Mispah books, Redhill, SURRE, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 160,19
EUR 28,38 per la spedizione da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
-
Data Mining and Diagnosing Ic Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: GreatBookPrices, Columbia, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 191,87
EUR 2,28 per la spedizione in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: As New. Unread book in perfect condition.
-
Data Mining and Diagnosing IC Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 106,99
EUR 23,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done. 250 pp. Englisch.
-
Data Mining and Diagnosing IC Fails
Libro 15 di 40: Frontiers in Electronic TestingDa: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 106,99
EUR 23,00 per la spedizione da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment. 272 pp. Englisch.
-
EUR 92,27
EUR 48,99 per la spedizione da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Makes various data mining and diagnostic techniques available in one place to professionalsThe techniques described in this book are not available in one place, and many are not even available in any bookPresents a new diagnosis technique S.
-
EUR 93,00
EUR 48,99 per la spedizione da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Makes various data mining and diagnostic techniques available in one place to professionalsThe techniques described in this book are not available in one place, and many are not even available in any bookPresents a new diagnosis technique S.
-
EUR 95,80
EUR 70,00 per la spedizione da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Data Mining and Diagnosing IC Fails | Leendert M. Huisman | Buch | xx | Englisch | 2005 | Springer US | EAN 9780387249933 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
