Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 159,38
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Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 158,00
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.
Da: California Books, Miami, FL, U.S.A.
EUR 193,27
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Da: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germania
EUR 195,00
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Aggiungi al carrellogebundene Ausgabe. Condizione: Gut. 549 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber und kann entsprechende Merkmale aufweisen (Rückenschild, Instituts-Stempel.). In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 990.
EUR 205,69
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EUR 205,93
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 217,99
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 217,99
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Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 171,26
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Editore: Springer Berlin Heidelberg, 2010
ISBN 10: 3642073522 ISBN 13: 9783642073526
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 213,99
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics andsupplies readers sufficient information to apply the methods themselves.
Da: California Books, Miami, FL, U.S.A.
EUR 230,51
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Editore: Springer Berlin Heidelberg, 2003
ISBN 10: 3540405194 ISBN 13: 9783540405191
Lingua: Inglese
Da: moluna, Greven, Germania
EUR 227,74
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Aggiungi al carrelloCondizione: New. The diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films. This book presents the method, theory and application of diffraction analysisOve.
Da: California Books, Miami, FL, U.S.A.
EUR 250,90
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EUR 242,40
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Da: Revaluation Books, Exeter, Regno Unito
EUR 251,74
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Aggiungi al carrelloPaperback. Condizione: Brand New. 317 pages. 8.27x5.83x0.67 inches. In Stock.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 204,52
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Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 204,78
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Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2010
ISBN 10: 3642073522 ISBN 13: 9783642073526
Lingua: Inglese
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Prima edizione
EUR 208,04
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Aggiungi al carrelloPaperback. Condizione: new. Paperback. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2003
ISBN 10: 3540405194 ISBN 13: 9783540405191
Lingua: Inglese
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
EUR 208,28
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 275,70
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EUR 276,50
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Aggiungi al carrelloCondizione: New. pp. 584.
Editore: Springer, Berlin, Springer Berlin Heidelberg, Springer, 2003
ISBN 10: 3540405194 ISBN 13: 9783540405191
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 280,05
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Aggiungi al carrelloBuch. Condizione: Neu. Neuware - Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics andsupplies readers sufficient information to apply the methods themselves.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 290,05
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Aggiungi al carrelloPaperback. Condizione: Like New. Like New. book.
EUR 324,77
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Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2010
ISBN 10: 3642073522 ISBN 13: 9783642073526
Lingua: Inglese
Da: AussieBookSeller, Truganina, VIC, Australia
Prima edizione
EUR 361,83
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Aggiungi al carrelloPaperback. Condizione: new. Paperback. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Editore: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Berlin, 2003
ISBN 10: 3540405194 ISBN 13: 9783540405191
Lingua: Inglese
Da: AussieBookSeller, Truganina, VIC, Australia
EUR 391,79
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Aggiungi al carrelloHardcover. Condizione: new. Hardcover. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Da: moluna, Greven, Germania
EUR 130,76
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Zeitschrift fuer Kristallograph.
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
EUR 160,61
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Aggiungi al carrelloPAP. Condizione: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Da: PBShop.store US, Wood Dale, IL, U.S.A.
EUR 167,65
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Aggiungi al carrelloPAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Editore: De Gruyter Oldenbourg Okt 2015, 2015
ISBN 10: 3486992554 ISBN 13: 9783486992557
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 158,00
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography. 320 pp. Englisch.