Da: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Hardcover. Condizione: Very Good. No Jacket. Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 103,66
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Aggiungi al carrelloCondizione: New.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 112,53
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Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 110,28
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Aggiungi al carrelloCondizione: New. In.
Condizione: New.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 122,00
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Aggiungi al carrelloCondizione: New. In.
Da: Revaluation Books, Exeter, Regno Unito
EUR 153,40
Quantità: 2 disponibili
Aggiungi al carrelloHardcover. Condizione: Brand New. 146 pages. 9.25x6.25x0.50 inches. In Stock.
Condizione: New. pp. 146.
Editore: Springer International Publishing, Springer Nature Switzerland Jul 2017, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 106,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 156 pp. Englisch.
Editore: Springer International Publishing, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 106,99
Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy.
Editore: Springer International Publishing, 2018
ISBN 10: 3319868551 ISBN 13: 9783319868554
Lingua: Inglese
Da: preigu, Osnabrück, Germania
EUR 102,30
Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip | Pascal Meinerzhagen (u. a.) | Taschenbuch | ix | Englisch | 2018 | Springer International Publishing | EAN 9783319868554 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Editore: Springer International Publishing, Springer International Publishing Mai 2018, 2018
ISBN 10: 3319868551 ISBN 13: 9783319868554
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 117,69
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 156 pp. Englisch.
Editore: Springer International Publishing, Springer International Publishing, 2018
ISBN 10: 3319868551 ISBN 13: 9783319868554
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 117,69
Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy.
Da: Revaluation Books, Exeter, Regno Unito
EUR 164,99
Quantità: 2 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. reprint edition. 146 pages. 9.25x6.10x0.36 inches. In Stock.
Editore: Springer International Publishing Jul 2017, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 106,99
Quantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy. 156 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 136,23
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand.
Editore: Springer International Publishing, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Lingua: Inglese
Da: moluna, Greven, Germania
EUR 89,99
Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides novel gain-cell embedded DRAM (GC-eDRAM) designs for various low-power VLSI SoC applicationsModels the statistical retention time distribution of GC-eDRAM and validates the model by silicon measurementsDescribes various memory op.
Editore: Springer International Publishing Mai 2018, 2018
ISBN 10: 3319868551 ISBN 13: 9783319868554
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 117,69
Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy. 156 pp. Englisch.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 136,88
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND.
Editore: Springer International Publishing, 2018
ISBN 10: 3319868551 ISBN 13: 9783319868554
Lingua: Inglese
Da: moluna, Greven, Germania
EUR 98,54
Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides novel gain-cell embedded DRAM (GC-eDRAM) designs for various low-power VLSI SoC applicationsModels the statistical retention time distribution of GC-eDRAM and validates the model by silicon measurementsDescribes various memory op.
Editore: Springer Nature Switzerland, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Lingua: Inglese
Da: preigu, Osnabrück, Germania
EUR 93,45
Quantità: 5 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip | Pascal Meinerzhagen (u. a.) | Buch | ix | Englisch | 2017 | Springer Nature Switzerland | EAN 9783319604015 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
Da: Majestic Books, Hounslow, Regno Unito
EUR 171,68
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 146.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 173,85
Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 146.