Condizione: Hervorragend. Zustand: Hervorragend | Seiten: 516 | Sprache: Englisch | Produktart: Bücher.
Da: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germania
EUR 20,00
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Aggiungi al carrellovii, 508 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Da: Antiquariat Bookfarm, Löbnitz, Germania
Hardcover. VII, 508. 333 illus., 26 illus. in color Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02774 9789811304538 Sprache: Englisch Gewicht in Gramm: 1150.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 129,90
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Aggiungi al carrelloCondizione: New. In.
Editore: Springer Nature Singapore, Springer Nature Singapore Jan 2019, 2019
ISBN 10: 9811344205 ISBN 13: 9789811344206
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 123,04
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Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 516 pp. Englisch.
Editore: Springer Nature Singapore, Springer Nature Singapore, 2019
ISBN 10: 9811344205 ISBN 13: 9789811344206
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 130,67
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Da: California Books, Miami, FL, U.S.A.
EUR 151,03
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 122,96
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Aggiungi al carrelloCondizione: New.
Editore: Springer Nature Singapore, Springer Nature Singapore Sep 2018, 2018
ISBN 10: 981130453X ISBN 13: 9789811304538
Lingua: Inglese
Da: buchversandmimpf2000, Emtmannsberg, BAYE, Germania
EUR 171,19
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 516 pp. Englisch.
Da: Ria Christie Collections, Uxbridge, Regno Unito
EUR 179,93
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
Editore: Springer Nature Singapore, Springer Nature Singapore, 2018
ISBN 10: 981130453X ISBN 13: 9789811304538
Lingua: Inglese
Da: AHA-BUCH GmbH, Einbeck, Germania
EUR 179,61
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Da: dsmbooks, Liverpool, Regno Unito
EUR 177,15
Convertire valutaQuantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: New. New. book.
Da: California Books, Miami, FL, U.S.A.
EUR 208,22
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Aggiungi al carrelloCondizione: New.
Da: Lucky's Textbooks, Dallas, TX, U.S.A.
EUR 169,44
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Aggiungi al carrelloCondizione: New.
Da: Books Puddle, New York, NY, U.S.A.
EUR 230,02
Convertire valutaQuantità: 4 disponibili
Aggiungi al carrelloCondizione: New. pp. 515.
Da: Mispah books, Redhill, SURRE, Regno Unito
EUR 233,30
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Aggiungi al carrelloHardcover. Condizione: New. New. book.
EUR 254,28
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Aggiungi al carrelloHardcover. Condizione: Brand New. 508 pages. 9.25x6.25x1.75 inches. In Stock.
Da: moluna, Greven, Germania
EUR 105,45
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Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.
Editore: Springer Nature Singapore Jan 2019, 2019
ISBN 10: 9811344205 ISBN 13: 9789811344206
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 123,04
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.
Da: moluna, Greven, Germania
EUR 144,94
Convertire valutaQuantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examines their crucial roles in modern materials researchShowcases recent advances in scanning electron mic.
Editore: Springer Nature Singapore Sep 2018, 2018
ISBN 10: 981130453X ISBN 13: 9789811304538
Lingua: Inglese
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
EUR 171,19
Convertire valutaQuantità: 2 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research.The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. 516 pp. Englisch.
Da: Majestic Books, Hounslow, Regno Unito
EUR 241,50
Convertire valutaQuantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 515.
Da: Biblios, Frankfurt am main, HESSE, Germania
EUR 248,16
Convertire valutaQuantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 515.