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Mechanical Reliability
Lingua: Inglese
Editore: John Wiley & Sons Inc--Halsted Press, 1972
ISBN 10: 0470138521 ISBN 13: 9780470138526
Da: Small World Books, Rochester, NY, U.S.A.
Valutazione del venditore 2 su 5 stelle
Prima edizione
Hardcover. Condizione: Very Good. Condizione sovraccoperta: Very Good. 1st American Edition. Dark covers with white lettering on spine. Former owner's name on front cover and thin brown line going down front endpaper probably caused by dust jacket's edge. Silver dust jacket with black lettering.
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EUR 16,65
Spedizione EUR 15,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,450grams, ISBN:0333138317.
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Mechanical Reliability
Da: Bingo Books 2, Vancouver, WA, U.S.A.
Valutazione del venditore 4 su 5 stelle
Hardcover. Condizione: Very Good. Condizione sovraccoperta: Very Good. hardback book and dust jacket in very good condition.
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Mechanical Reliability
Da: Book Bar Wales, Wrexham, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 11,80
Spedizione EUR 23,49
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloSoft cover. Condizione: Very Good. 2nd Edition. No inscriptions and very little use. A clean, tight copy of xvi. 492pp.
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The Control and Assurance of Quality, Reliability and Safety
Da: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Valutazione del venditore 5 su 5 stelle
Hardcover. Condizione: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics ? 2004 (MRS Proceedings)
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: California Books, Miami, FL, U.S.A.
Valutazione del venditore 4 su 5 stelle
EUR 41,68
Spedizione gratuita
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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EUR 27,72
Spedizione EUR 15,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9780333694657.
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EUR 29,43
Spedizione EUR 15,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9780333405871.
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EUR 29,50
Spedizione EUR 15,59
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9780333694657.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics ? 2004 (MRS Proceedings)
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Ria Christie Collections, Uxbridge, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 36,24
Spedizione EUR 13,73
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. In.
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Mechanical Reliability and Design
Da: WeBuyBooks, Rossendale, LANCS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 42,32
Spedizione EUR 8,63
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Very Good. Most items will be dispatched the same or the next working day. A copy that has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.
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Mechanical Reliability and Design
Da: WeBuyBooks, Rossendale, LANCS, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 42,32
Spedizione EUR 8,63
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004
Lingua: Inglese
Editore: Cambridge University Press 2014-05, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Chiron Media, Wallingford, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 34,28
Spedizione EUR 17,75
Spedito da Regno Unito a U.S.A.Quantità: 10 disponibili
Aggiungi al carrelloPF. Condizione: New.
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Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics - 2004 (MRS Proceedings)
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlanda
Valutazione del venditore 5 su 5 stelle
EUR 45,34
Spedizione EUR 10,50
Spedito da Irlanda a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics, 2004
Lingua: Inglese
Editore: Cambridge University Press CUP, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Books Puddle, New York, NY, U.S.A.
Valutazione del venditore 4 su 5 stelle
Condizione: New. pp. 422.
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Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics - 2004 (MRS Proceedings)
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Kennys Bookstore, Olney, MD, U.S.A.
Valutazione del venditore 5 su 5 stelle
EUR 55,93
Spedizione EUR 9,04
Spedito in U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New.
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Mechanical reliability
Editore: Macmillan, 1972
Da: Librodifaccia, Alessandria, AL, Italia
Valutazione del venditore 5 su 5 stelle
EUR 9,00
Spedizione EUR 27,90
Spedito da Italia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloCondizione: Buone. inglese Condizioni dell'esterno: Discrete con difetti, strappi Condizioni dell'interno: Buone.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
EUR 56,40
Spedizione EUR 63,04
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The scaling of device dimensions with a simultaneous increase in functional density has imposed tremendous challenges for materials, technology, integration and reliability of interconnects. To meet requirements of the ITRS roadmap, new materials are being introduced at a faster pace in all functions of multilevel interconnects. The issues addressed in this book cannot be dispelled as simply selecting a low-k material and integrating it into a copper damascene process. The intricacies of the back end for sub-100nm technology include novel processing of low-k materials, employing pore-sealing techniques and capping layers, introducing advanced dielectric and diffusion barriers, and developing novel integration schemes. This is in addition to concerns of performance, yield, and reliability appropriate to nanoscaled interconnects. Although many challenges continue to impede progress along the ITRS roadmap, the contributions in this book confront them head-on. It provides a scientific understanding of the issues and stimulate new approaches to advanced multilevel interconnects.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004 (Paperback)
Lingua: Inglese
Editore: Cambridge University Press, Cambridge, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Grand Eagle Retail, Bensenville, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
Paperback. Condizione: new. Paperback. The scaling of device dimensions with a simultaneous increase in functional density has imposed tremendous challenges for materials, technology, integration and reliability of interconnects. To meet requirements of the ITRS roadmap, new materials are being introduced at a faster pace in all functions of multilevel interconnects. The issues addressed in this book cannot be dispelled as simply selecting a low-k material and integrating it into a copper damascene process. The intricacies of the back end for sub-100nm technology include novel processing of low-k materials, employing pore-sealing techniques and capping layers, introducing advanced dielectric and diffusion barriers, and developing novel integration schemes. This is in addition to concerns of performance, yield, and reliability appropriate to nanoscaled interconnects. Although many challenges continue to impede progress along the ITRS roadmap, the contributions in this book confront them head-on. It provides a scientific understanding of the issues and stimulate new approaches to advanced multilevel interconnects. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics â" 2004
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Revaluation Books, Exeter, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 34,54
Spedizione EUR 14,33
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: Brand New. 1st edition. 422 pages. 8.90x6.00x1.00 inches. In Stock. This item is printed on demand.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: THE SAINT BOOKSTORE, Southport, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 40,76
Spedizione EUR 18,74
Spedito da Regno Unito a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloPaperback / softback. Condizione: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics, 2004
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Majestic Books, Hounslow, Regno Unito
Valutazione del venditore 4 su 5 stelle
EUR 54,27
Spedizione EUR 7,45
Spedito da Regno Unito a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. Print on Demand pp. 422.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics, 2004
Lingua: Inglese
Editore: Cambridge University Press, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: Biblios, Frankfurt am main, HESSE, Germania
Valutazione del venditore 4 su 5 stelle
EUR 54,97
Spedizione EUR 9,95
Spedito da Germania a U.S.A.Quantità: 4 disponibili
Aggiungi al carrelloCondizione: New. PRINT ON DEMAND pp. 422.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004 (Paperback)
Lingua: Inglese
Editore: Cambridge University Press, Cambridge, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: CitiRetail, Stevenage, Regno Unito
Valutazione del venditore 5 su 5 stelle
EUR 42,48
Spedizione EUR 42,40
Spedito da Regno Unito a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. The scaling of device dimensions with a simultaneous increase in functional density has imposed tremendous challenges for materials, technology, integration and reliability of interconnects. To meet requirements of the ITRS roadmap, new materials are being introduced at a faster pace in all functions of multilevel interconnects. The issues addressed in this book cannot be dispelled as simply selecting a low-k material and integrating it into a copper damascene process. The intricacies of the back end for sub-100nm technology include novel processing of low-k materials, employing pore-sealing techniques and capping layers, introducing advanced dielectric and diffusion barriers, and developing novel integration schemes. This is in addition to concerns of performance, yield, and reliability appropriate to nanoscaled interconnects. Although many challenges continue to impede progress along the ITRS roadmap, the contributions in this book confront them head-on. It provides a scientific understanding of the issues and stimulate new approaches to advanced multilevel interconnects. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004
Lingua: Inglese
Editore: Cambridge University Press, 2012
ISBN 10: 1107409225 ISBN 13: 9781107409224
EUR 42,05
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.KlappentextThe MRS Symposium Proceeding series is an internationally recognised reference suitable for research.
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics 2004 (Paperback)
Lingua: Inglese
Editore: Cambridge University Press, Cambridge, 2014
ISBN 10: 1107409225 ISBN 13: 9781107409224
Da: AussieBookSeller, Truganina, VIC, Australia
Valutazione del venditore 5 su 5 stelle
EUR 65,51
Spedizione EUR 31,86
Spedito da Australia a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloPaperback. Condizione: new. Paperback. The scaling of device dimensions with a simultaneous increase in functional density has imposed tremendous challenges for materials, technology, integration and reliability of interconnects. To meet requirements of the ITRS roadmap, new materials are being introduced at a faster pace in all functions of multilevel interconnects. The issues addressed in this book cannot be dispelled as simply selecting a low-k material and integrating it into a copper damascene process. The intricacies of the back end for sub-100nm technology include novel processing of low-k materials, employing pore-sealing techniques and capping layers, introducing advanced dielectric and diffusion barriers, and developing novel integration schemes. This is in addition to concerns of performance, yield, and reliability appropriate to nanoscaled interconnects. Although many challenges continue to impede progress along the ITRS roadmap, the contributions in this book confront them head-on. It provides a scientific understanding of the issues and stimulate new approaches to advanced multilevel interconnects. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
