Scanning electron microscopy probe (63 risultati)

No Binding. Condizione: Very Good. ORIGINAL 1980 Article, disbound from journal; no covers; in very good condition. Journal.

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Paperback or Softback. Condizione: New. Correlating structure and function in small molecule organic solar cells by means of scanning probe and electron microscopy. Book.

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Condizione: Very Good. 336 pp., Hardcover, light wear to the top of the spine, bookplate to the rear pastedown else very good. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.…

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this work nanoscale properties in active layers of small molecule organic solar cells are studied regarding their impact on device performance. For this, the effect of variations in stack design and process conditions is examined both electrically and with high resolution imaging techniques. Two topics are addressed: (i) the visualization of charge extraction/injection properties of solar cell contacts and (ii) the tailoring of structural properties of co-evaporated material blends for bulk heterojunction (BHJ) organic solar cells.(i) We study the impact of controlled contact manipulation on the internal electric potential distribution of fluorinated zincphtalocyanine (F4ZnPc)/fullerene (C60) organic solar cells under operating conditions. In a detailed analytical study using photoelectron spectroscopy and in-operando scanning Kelvin probe microscopy it is demonstrated that the electric field distribution of organic solar cells at the maximum power point depends in an overproportional manner on contact properties and ranges from bulk to contact dominated even for solar cells with decent device performance.(ii) The morphology of co-evaporated active layer blends depends on both substrate and substrate temperature. Here we study the morphology of F4ZnPc:C60 blends with analytical transmission electron microscopy. For all substrates used is found that co-evaporation of the materials at elevated substrate temperature (100° Cel) induces a distinct phase segregation of F4ZnPc and C60. However, only when using a C60 underlayer, as in inverted devices, also the crystallinity of the segregated C60 phase increases. There is only a slight increase in crystallinity when F4ZnPc acts as an underlayer, as typically for non-inverted devices. Solar cell characterization reveals that the crystalline C60 domains are the main driving force for enhanced free charge carrier generation and higher power conversion efficiencies. With this we could provide a novel explanation why record efficiencies of small molecule organic solar cells are realized in inverted device architecture only.…

8vo Hardcover. Condizione: Very Good. 1st. 336pp. White pages are unmarked with some b/w photos and figures. Binding is tight, hinges are secure. Glossy blue boards are clean with gently bumped corners. Name penned on top of front fly.

Hardcover. Condizione: New. HardCover Pub Date: December 2009 Pages: 206 Language: Chinese in Publisher: Shanghai Science and Technology Press. the foundation and application of scanning electron microscopy and electron probe through research instance. introduced a scanning electron microscope and electron probe in materials research. especially in the study of inorganic non-metallic materials. The book is divided into seven chapters. the content involves scanning electron microscopy and electron probe and scanning elec.…

Hardcover. Condizione: As New. Condizione sovraccoperta: , 0792399897. . . . . 8vo, hardcover. No dj. As new condition. No wear inside or out: crisp, clean - pristine. 336 pp.

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PAP. Condizione: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

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Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . …

Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 170 x 28. Weight in Grams: 896. . 1999. Hardback. . . . . …

Taschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.…

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.…

Condizione: Gut. Zustand: Gut | Seiten: 336 | Sprache: Englisch | Produktart: Bücher | 2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.…

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Condizione: New. Proceedings of the NATO Advanced Study Institute, held in Erice, Italy, 14-25 April, 1999 Editor(s): Rickerby, David G.; Valdre, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy); Valdre, Ugo. Series: NATO Science Series E. Num Pages: 513 pages, biography. BIC Classification: TGMT1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 160 x 26. Weight in Grams: 716. . 1999. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . Books ship from the US and Ireland. …