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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Da: Better World Books, Mishawaka, IN, U.S.A.
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Condizione: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Scanning Probe Microscopy Of Functional Materials: Nanoscale Imaging And Spectroscopy
Da: Basi6 International, Irving, TX, U.S.A.
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Scanning Probe Microscopy Of Functional Materials: Nanoscale Imaging And Spectroscopy
Da: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
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Scanning Probe Microscopy of Functional Materials
Da: Books Puddle, New York, NY, U.S.A.
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Condizione: New. pp. xviii + 555.
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Scanning Probe Microscopy of Functional Materials
Da: Majestic Books, Hounslow, Regno Unito
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EUR 207,59
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Aggiungi al carrelloCondizione: New. pp. xviii + 555 Illus.
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Scanning Probe Microscopy of Functional Materials
Da: Biblios, Frankfurt am main, HESSE, Germania
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EUR 209,26
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
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EUR 216,46
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Da: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 222,85
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Da: Ria Christie Collections, Uxbridge, Regno Unito
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Da: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 236,80
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Da: GreatBookPrices, Columbia, MD, U.S.A.
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EUR 240,06
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Da: GreatBookPricesUK, Woodford Green, Regno Unito
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EUR 243,90
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Da: Books Puddle, New York, NY, U.S.A.
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Condizione: New. pp. 573.
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EUR 184,85
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Spedito da Germania a U.S.A.Quantità: 5 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Scanning Probe Microscopy of Functional Materials | Nanoscale Imaging and Spectroscopy | Alexei Gruverman (u. a.) | Taschenbuch | xviii | Englisch | 2016 | Springer US | EAN 9781493939473 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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hardcover. Condizione: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Lingua: Inglese
Editore: Springer New York, Springer US, 2016
ISBN 10: 1493939475 ISBN 13: 9781493939473
EUR 223,11
Spedizione EUR 64,31
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Lingua: Inglese
Editore: Springer New York, Springer New York, 2010
ISBN 10: 144196567X ISBN 13: 9781441965677
EUR 225,03
Spedizione EUR 65,11
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... II: Mathematics, Physics and Chemistry, 186)
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryDa: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 307,34
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... II: Mathematics, Physics and Chemistry, 186)
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryDa: Ria Christie Collections, Uxbridge, Regno Unito
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EUR 307,34
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Da: Revaluation Books, Exeter, Regno Unito
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EUR 304,78
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Aggiungi al carrelloHardcover. Condizione: Brand New. 600 pages. 9.20x6.40x1.10 inches. In Stock.
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Da: Mispah books, Redhill, SURRE, Regno Unito
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EUR 342,13
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Aggiungi al carrelloHardcover. Condizione: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryEUR 336,82
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryEUR 336,82
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloKartoniert / Broschiert. Condizione: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
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Scanning Probe Microscopy: Characterization, Nanofabricatoin And Device Application of Functional Materials
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryDa: Revaluation Books, Exeter, Regno Unito
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EUR 446,76
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Aggiungi al carrelloPaperback. Condizione: Brand New. 1st edition. 488 pages. 9.25x6.25x1.25 inches. In Stock.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryEUR 474,63
Spedizione EUR 63,96
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Libro 147 di 241: NATO Science Series II: Mathematics, Physics and ChemistryEUR 474,63
Spedizione EUR 64,76
Spedito da Germania a U.S.A.Quantità: 1 disponibili
Aggiungi al carrelloBuch. Condizione: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
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Scanning Probe Microscopy of Functional Materials (eng)
Da: Brook Bookstore On Demand, Napoli, NA, Italia
Valutazione del venditore 4 su 5 stelle
EUR 166,29
Spedizione EUR 11,00
Spedito da Italia a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: new. Questo è un articolo print on demand.
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EUR 180,07
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloCondizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses.
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EUR 180,07
Spedizione EUR 48,99
Spedito da Germania a U.S.A.Quantità: Più di 20 disponibili
Aggiungi al carrelloGebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses.
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Scanning Probe Microscopy of Functional Materials
Lingua: Inglese
Editore: Springer New York Aug 2016, 2016
ISBN 10: 1493939475 ISBN 13: 9781493939473
Da: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germania
Valutazione del venditore 5 su 5 stelle
EUR 213,99
Spedizione EUR 23,00
Spedito da Germania a U.S.A.Quantità: 2 disponibili
Aggiungi al carrelloTaschenbuch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. 576 pp. Englisch.
