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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint) - Brossura
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972
The work of the Program is divided into a number of tasks, each directed toward the study of a particular material or device property or measurement technique. This report is subdivided according to these tasks. Highlights of activity during the quarter are given in section 2. Section 3 deals with tasks on methods of measurement for materials; section 4, with those on methods of measurement for process control.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Da: PBShop.store US, Wood Dale, IL, U.S.A.
Valutazione del venditore 5 su 5 stelle
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000. Codice articolo LW-9780365302025
Quantità: 15 disponibili
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Da: PBShop.store UK, Fairford, GLOS, Regno Unito
Valutazione del venditore 5 su 5 stelle
PAP. Condizione: New. New Book. Shipped from UK. Established seller since 2000. Codice articolo LW-9780365302025
Quantità: 15 disponibili
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Methods of Measurement for Semiconductor Materials, Process Control, and
Print on DemandDa: Forgotten Books, London, Regno Unito
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Paperback. Condizione: New. Print on Demand. This book delves into the field of methods of measurement for semiconductor materials, process control, and devices. It encompasses a wide range of topics, including resistivity, gold-doped silicon, infrared methods, die attachment evaluation, thermal properties of devices, microwave device measurements, and carrier transport in junction devices. The author, an expert in the field, provides a comprehensive overview of the current state of the art in these areas. The book is highly technical and assumes a strong background in semiconductor physics and measurement techniques. It is primarily intended for researchers, engineers, and scientists working in the semiconductor industry or in related fields. The insights presented in this book are essential for advancing the development and manufacturing of high-quality semiconductor devices. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Codice articolo 9780365302025_0
Quantità: Più di 20 disponibili