Scanning Probe Microscopy: Electrical And Electromechanical Phenomena at the Nanoscale - Rilegato

Rilegato

ISBN 10: 0387286675 ISBN 13: 9780387286679

Casa editrice: Springer Nature, 2006

Riassunto

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

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Dalla quarta di copertina

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Dettagli dell?edizione

• Editore: Springer Nature
• Data di pubblicazione: 2006
• Lingua: Inglese
• ISBN 10: 0387286675
• ISBN 13: 9780387286679
• Rilegatura: Copertina rigida
• Numero edizione: 1
• Numero di pagine: 980
• Redattore: Kalinin Sergei, Gruverman Alexei
• Contatto del produttore: non disponibile
• Persona responsabile: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Germania