ISBN: 9780387286679 - scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale (14 risultati)

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Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condizione: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

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Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: New. pp. xl + 980.

Condizione: New. pp. xl + 980 Illus.

Condizione: New. pp. xl + 980.

Condizione: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condizione: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Buch. Condizione: Neu. Druck auf Anfrage Neuware - Printed after ordering - Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.…

Gebunden. Condizione: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Appeals to researchers from disciplines as diverse as physics, chemistry, biology, molecular engineering and biotechnologyPresents practical aspects of materials characterization as applied to semiconductors, ferroelectrics, dielectrics, polymers..…

Buch. Condizione: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs. 1040 pp. Englisch.…

Buch. Condizione: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 1040 pp. Englisch.…